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Pregled bibliografske jedinice broj: 645659

Long-term accuracy and precision of PIXE and PIGE measurements for thin and thick sample analyses


Cohen, David D.; Siegele, Rainer; Orlić, Ivo; Stelcer, Ed
Long-term accuracy and precision of PIXE and PIGE measurements for thin and thick sample analyses // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 189 (2002), 1/4; 81-85 doi:10.1016/S0168-583X(01)01011-4 (međunarodna recenzija, članak, znanstveni)


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Naslov
Long-term accuracy and precision of PIXE and PIGE measurements for thin and thick sample analyses

Autori
Cohen, David D. ; Siegele, Rainer ; Orlić, Ivo ; Stelcer, Ed

Izvornik
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (0168-583X) 189 (2002), 1/4; 81-85

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
PIXE ; accuracy ; precision

Sažetak
This paper describes PIXE/PIGE measurements on thin Micromatter Standard (5%) foils run over a period of 10 years. The selected foils were typically 50 lg/cm2 thick and covered the commonly used PIXE X-ray energy range 1.4– 20 keV and the light elements F and Na for PIGE studies. For the thousands of thick obsidian and pottery samples analysed over a 6-year period, the Ohio Red Clay standard has been used for both PIXE and PIGE calibration of a range of elements from Li to Rb. For PIXE, the long-term accuracy could be as low as 1.6% for major elements with precision ranging from 5% to 10% depending on the elemental concentration. For PIGE, accuracies were around 5% with precision ranging from 5% in thick samples to 15% in thin samples or for low yield c-ray production.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Ustanove:
Sveučilište u Rijeci - Odjel za fiziku

Poveznice na cjeloviti tekst rada:

doi www.sciencedirect.com ac.els-cdn.com dx.doi.org

Citiraj ovu publikaciju:

Cohen, David D.; Siegele, Rainer; Orlić, Ivo; Stelcer, Ed
Long-term accuracy and precision of PIXE and PIGE measurements for thin and thick sample analyses // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 189 (2002), 1/4; 81-85 doi:10.1016/S0168-583X(01)01011-4 (međunarodna recenzija, članak, znanstveni)
Cohen, D., Siegele, R., Orlić, I. & Stelcer, E. (2002) Long-term accuracy and precision of PIXE and PIGE measurements for thin and thick sample analyses. Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 189 (1/4), 81-85 doi:10.1016/S0168-583X(01)01011-4.
@article{article, author = {Cohen, David D. and Siegele, Rainer and Orli\'{c}, Ivo and Stelcer, Ed}, year = {2002}, pages = {81-85}, DOI = {10.1016/S0168-583X(01)01011-4}, keywords = {PIXE, accuracy, precision}, journal = {Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms}, doi = {10.1016/S0168-583X(01)01011-4}, volume = {189}, number = {1/4}, issn = {0168-583X}, title = {Long-term accuracy and precision of PIXE and PIGE measurements for thin and thick sample analyses}, keyword = {PIXE, accuracy, precision} }
@article{article, author = {Cohen, David D. and Siegele, Rainer and Orli\'{c}, Ivo and Stelcer, Ed}, year = {2002}, pages = {81-85}, DOI = {10.1016/S0168-583X(01)01011-4}, keywords = {PIXE, accuracy, precision}, journal = {Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms}, doi = {10.1016/S0168-583X(01)01011-4}, volume = {189}, number = {1/4}, issn = {0168-583X}, title = {Long-term accuracy and precision of PIXE and PIGE measurements for thin and thick sample analyses}, keyword = {PIXE, accuracy, precision} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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