Pregled bibliografske jedinice broj: 645659
Long-term accuracy and precision of PIXE and PIGE measurements for thin and thick sample analyses
Long-term accuracy and precision of PIXE and PIGE measurements for thin and thick sample analyses // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 189 (2002), 1/4; 81-85 doi:10.1016/S0168-583X(01)01011-4 (međunarodna recenzija, članak, znanstveni)
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Naslov
Long-term accuracy and precision of PIXE and PIGE measurements for thin and thick sample analyses
Autori
Cohen, David D. ; Siegele, Rainer ; Orlić, Ivo ; Stelcer, Ed
Izvornik
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (0168-583X) 189
(2002), 1/4;
81-85
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
PIXE ; accuracy ; precision
Sažetak
This paper describes PIXE/PIGE measurements on thin Micromatter Standard (5%) foils run over a period of 10 years. The selected foils were typically 50 lg/cm2 thick and covered the commonly used PIXE X-ray energy range 1.4– 20 keV and the light elements F and Na for PIGE studies. For the thousands of thick obsidian and pottery samples analysed over a 6-year period, the Ohio Red Clay standard has been used for both PIXE and PIGE calibration of a range of elements from Li to Rb. For PIXE, the long-term accuracy could be as low as 1.6% for major elements with precision ranging from 5% to 10% depending on the elemental concentration. For PIGE, accuracies were around 5% with precision ranging from 5% in thick samples to 15% in thin samples or for low yield c-ray production.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove:
Sveučilište u Rijeci - Odjel za fiziku
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus