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Pregled bibliografske jedinice broj: 633294

Broadband Measurement of the Magnetic Moment Normal to the Printed Circuit Board plane using TEM Cell and Phase Information


Blečić, Raul; Bako, Niko; Gillon, Renaud; Barić, Adrijan
Broadband Measurement of the Magnetic Moment Normal to the Printed Circuit Board plane using TEM Cell and Phase Information // Proceedings of the International Symposium on Electromagnetic Compatibility (EMC Europe)
Briž: Institute of Electrical and Electronics Engineers (IEEE), 2013. str. 955-960 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)


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Naslov
Broadband Measurement of the Magnetic Moment Normal to the Printed Circuit Board plane using TEM Cell and Phase Information

Autori
Blečić, Raul ; Bako, Niko ; Gillon, Renaud ; Barić, Adrijan

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Proceedings of the International Symposium on Electromagnetic Compatibility (EMC Europe) / - Briž : Institute of Electrical and Electronics Engineers (IEEE), 2013, 955-960

Skup
International Symposium on Electromagnetic Compatibility (EMC Europe)

Mjesto i datum
Brugge, Belgija, 02.09.2013. - 06.09.2013

Vrsta sudjelovanja
Poster

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
TEM cell to open-area test site (OATS) mea-surements correlation; magnetic loop; magnetic moment; VNA measurements; EM simulations

Sažetak
In this paper the measurement of the magnetic mo- ment normal to the printed circuit board (PCB) by a Transverse Electromagnetic (TEM) cell is presented. The PCB is placed inside a TEM cell perpendicular to the septum by using two boards: a motherboard and a daughterboard. The daughterboard represents the PCB and device under test (DUT). An edge connector is vertically mounted on the motherboard to enable the placement of the daughterboard inside the TEM cell and to enable the communication between the daughterboard and the outside world. The phase information is used to distinguish between the magnetic and electric moments without using a hybrid coupler. The absence of the hybrid coupler allows to perform the measurements over a broad frequency range. The method is validated by measuring the PCB circular current loops and by comparing the results to the theory and a very good match is obtained. The complete test system consisting of the TEM cell and the loops is simulated in a full-wave electromagnetic solver and a very good match is obtained, too. The full- wave simulations are used to investigate the limitations of the presented method.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika



POVEZANOST RADA


Projekti:
036-0361621-1622 - Kvaliteta signala u integriranim sklopovima s mješovitim signalom (Barić, Adrijan, MZO ) ( CroRIS)

Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb

Profili:

Avatar Url Raul Blečić (autor)

Avatar Url Niko Bako (autor)

Avatar Url Adrijan Barić (autor)

Citiraj ovu publikaciju:

Blečić, Raul; Bako, Niko; Gillon, Renaud; Barić, Adrijan
Broadband Measurement of the Magnetic Moment Normal to the Printed Circuit Board plane using TEM Cell and Phase Information // Proceedings of the International Symposium on Electromagnetic Compatibility (EMC Europe)
Briž: Institute of Electrical and Electronics Engineers (IEEE), 2013. str. 955-960 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
Blečić, R., Bako, N., Gillon, R. & Barić, A. (2013) Broadband Measurement of the Magnetic Moment Normal to the Printed Circuit Board plane using TEM Cell and Phase Information. U: Proceedings of the International Symposium on Electromagnetic Compatibility (EMC Europe).
@article{article, author = {Ble\v{c}i\'{c}, Raul and Bako, Niko and Gillon, Renaud and Bari\'{c}, Adrijan}, year = {2013}, pages = {955-960}, keywords = {TEM cell to open-area test site (OATS) mea-surements correlation, magnetic loop, magnetic moment, VNA measurements, EM simulations}, title = {Broadband Measurement of the Magnetic Moment Normal to the Printed Circuit Board plane using TEM Cell and Phase Information}, keyword = {TEM cell to open-area test site (OATS) mea-surements correlation, magnetic loop, magnetic moment, VNA measurements, EM simulations}, publisher = {Institute of Electrical and Electronics Engineers (IEEE)}, publisherplace = {Brugge, Belgija} }
@article{article, author = {Ble\v{c}i\'{c}, Raul and Bako, Niko and Gillon, Renaud and Bari\'{c}, Adrijan}, year = {2013}, pages = {955-960}, keywords = {TEM cell to open-area test site (OATS) mea-surements correlation, magnetic loop, magnetic moment, VNA measurements, EM simulations}, title = {Broadband Measurement of the Magnetic Moment Normal to the Printed Circuit Board plane using TEM Cell and Phase Information}, keyword = {TEM cell to open-area test site (OATS) mea-surements correlation, magnetic loop, magnetic moment, VNA measurements, EM simulations}, publisher = {Institute of Electrical and Electronics Engineers (IEEE)}, publisherplace = {Brugge, Belgija} }




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