Pretražite po imenu i prezimenu autora, mentora, urednika, prevoditelja

Napredna pretraga

Pregled bibliografske jedinice broj: 625337

Estimation of Insulated-gate Bipolar Transistor Operating Temperature: Simulation and Experiment


Bahun, Ivan; Šunde, Viktor; Jakopović, Željko
Estimation of Insulated-gate Bipolar Transistor Operating Temperature: Simulation and Experiment // Journal of Power Electronics, 13 (2013), 4; 729-736 (međunarodna recenzija, članak, znanstveni)


CROSBI ID: 625337 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Estimation of Insulated-gate Bipolar Transistor Operating Temperature: Simulation and Experiment

Autori
Bahun, Ivan ; Šunde, Viktor ; Jakopović, Željko

Izvornik
Journal of Power Electronics (1598-2092) 13 (2013), 4; 729-736

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
IGBT; operating temperature measurement; threshold voltage; temperature sensitive electrical parameter

Sažetak
Knowledge of a power semiconductor’s operating temperature is important in circuit design and also converter control. Designing appropriate circuitry for virtual junction temperature measurement under real operating conditions that do not affect regular circuit operation is a demanding task for engineers. The proposed method enables a virtual junction temperature estimation based on the real-time measurement of a semiconductor’s quasi-threshold voltage using a dedicated modified gate driver circuit. Before the real circuit was realised, a simulation was conducted to verify the concept and to obtain the basic properties and potential drawbacks of the proposed method.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika



POVEZANOST RADA


Projekti:
036-0362978-1574 - Pretvarači za tramvajska vozila i elektromotorne vlakove (Šunde, Viktor, MZO ) ( CroRIS)
036-0362978-2314 - Pretvarači povećane djelotvornosti u sučelju obnovljivih izvora i mreže (Jakopović, Željko, MZO ) ( CroRIS)

Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb

Profili:

Avatar Url Željko Jakopović (autor)

Avatar Url Viktor Šunde (autor)

Avatar Url Ivan Bahun (autor)


Citiraj ovu publikaciju:

Bahun, Ivan; Šunde, Viktor; Jakopović, Željko
Estimation of Insulated-gate Bipolar Transistor Operating Temperature: Simulation and Experiment // Journal of Power Electronics, 13 (2013), 4; 729-736 (međunarodna recenzija, članak, znanstveni)
Bahun, I., Šunde, V. & Jakopović, Ž. (2013) Estimation of Insulated-gate Bipolar Transistor Operating Temperature: Simulation and Experiment. Journal of Power Electronics, 13 (4), 729-736.
@article{article, author = {Bahun, Ivan and \v{S}unde, Viktor and Jakopovi\'{c}, \v{Z}eljko}, year = {2013}, pages = {729-736}, keywords = {IGBT, operating temperature measurement, threshold voltage, temperature sensitive electrical parameter}, journal = {Journal of Power Electronics}, volume = {13}, number = {4}, issn = {1598-2092}, title = {Estimation of Insulated-gate Bipolar Transistor Operating Temperature: Simulation and Experiment}, keyword = {IGBT, operating temperature measurement, threshold voltage, temperature sensitive electrical parameter} }
@article{article, author = {Bahun, Ivan and \v{S}unde, Viktor and Jakopovi\'{c}, \v{Z}eljko}, year = {2013}, pages = {729-736}, keywords = {IGBT, operating temperature measurement, threshold voltage, temperature sensitive electrical parameter}, journal = {Journal of Power Electronics}, volume = {13}, number = {4}, issn = {1598-2092}, title = {Estimation of Insulated-gate Bipolar Transistor Operating Temperature: Simulation and Experiment}, keyword = {IGBT, operating temperature measurement, threshold voltage, temperature sensitive electrical parameter} }

Časopis indeksira:


  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Uključenost u ostale bibliografske baze podataka::


  • INSPEC





Contrast
Increase Font
Decrease Font
Dyslexic Font