Pregled bibliografske jedinice broj: 625337
Estimation of Insulated-gate Bipolar Transistor Operating Temperature: Simulation and Experiment
Estimation of Insulated-gate Bipolar Transistor Operating Temperature: Simulation and Experiment // Journal of Power Electronics, 13 (2013), 4; 729-736 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 625337 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Estimation of Insulated-gate Bipolar Transistor Operating Temperature: Simulation and Experiment
Autori
Bahun, Ivan ; Šunde, Viktor ; Jakopović, Željko
Izvornik
Journal of Power Electronics (1598-2092) 13
(2013), 4;
729-736
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
IGBT; operating temperature measurement; threshold voltage; temperature sensitive electrical parameter
Sažetak
Knowledge of a power semiconductor’s operating temperature is important in circuit design and also converter control. Designing appropriate circuitry for virtual junction temperature measurement under real operating conditions that do not affect regular circuit operation is a demanding task for engineers. The proposed method enables a virtual junction temperature estimation based on the real-time measurement of a semiconductor’s quasi-threshold voltage using a dedicated modified gate driver circuit. Before the real circuit was realised, a simulation was conducted to verify the concept and to obtain the basic properties and potential drawbacks of the proposed method.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika
POVEZANOST RADA
Projekti:
036-0362978-1574 - Pretvarači za tramvajska vozila i elektromotorne vlakove (Šunde, Viktor, MZO ) ( CroRIS)
036-0362978-2314 - Pretvarači povećane djelotvornosti u sučelju obnovljivih izvora i mreže (Jakopović, Željko, MZO ) ( CroRIS)
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
Uključenost u ostale bibliografske baze podataka::
- INSPEC