Pregled bibliografske jedinice broj: 606947
Analysis of Singapore marine sediments by PIXE
Analysis of Singapore marine sediments by PIXE // Nuclear instruments & methods in physics research. Section B, 136/138 (1998), 1013-1017 doi:10.1016/S0168-583X(97)00895-1 (međunarodna recenzija, članak, znanstveni)
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Naslov
Analysis of Singapore marine sediments by PIXE
Autori
Tang, S.M. ; Orlić, Ivica ; Wu, X.K.
Izvornik
Nuclear instruments & methods in physics research. Section B (0168-583X) 136/138
(1998);
1013-1017
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
marine sediment; metallic pollutants; concentration depth profile; proton-induced X-ray emission; X-ray fluorescence
Sažetak
Thirty eight core samples of sediment were collected from seven coastal zones around the Island of Singapore for the purpose of surveying the concentrations of metallic pollutants in marine sediments. The samples were analysed by means of the PIXE technique to obtain the concentration of the trace metals Cr, Mn, Ni, Cu, Zn, As and Pb. Some of them were also analysed with the XRF technique to determine the concentration of Sn. The survey provided valuable information abouth the levels of marine pollution in the various coastal zones and shed light on the major source of same of the pollutants. Intersting concentration depth profiles of the metallic pollutants in sediments were also obtained from a number of the core samples collected. The concentration depth profiles of Cu, Zn, Sn and Pb obtained from one of the core samples exhibited a steep decrease at a depth of 10cm, implying that a sudden increase of these pollutants occurred some 20-33 years ago.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Napomena
Rad je prezentiran na skupu Conference on Beam Analysis, održanom od 27.07.–01.08.1997. g., Lisabon, Portugal ; Maria Fernanda Da Silva, Jose Carvalho Soares, Mark Breese (ur.).
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Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus