Pregled bibliografske jedinice broj: 603111
Radiation hardness of single crystal CVD diamond detector tested with MeV energy ions
Radiation hardness of single crystal CVD diamond detector tested with MeV energy ions // 2nd RBI Detector Workshop "Diamond Detectors Development and Applications": Book of Abstracts / Milko Jakšić, Tome Antičić, Mladen Kiš (ur.).
Zagreb: Institut Ruđer Bošković, 2012. str. 12-12 (predavanje, domaća recenzija, sažetak, znanstveni)
CROSBI ID: 603111 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Radiation hardness of single crystal CVD diamond detector tested with MeV energy ions
Autori
Zamboni, Ivana ; Pastuović, Željko ; Jakšić, Milko
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
2nd RBI Detector Workshop "Diamond Detectors Development and Applications": Book of Abstracts
/ Milko Jakšić, Tome Antičić, Mladen Kiš - Zagreb : Institut Ruđer Bošković, 2012, 12-12
ISBN
978-953-6690-91-6
Skup
2nd RBI Detector Workshop "Diamond Detectors Development and Applications"
Mjesto i datum
NP Plitvička jezera, Hrvatska, 07.05.2012. - 10.05.2012
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Domaća recenzija
Ključne riječi
single crystal CVD diamond detector; radiation hardness; ion micro-beam; IBIC; CCE
Sažetak
The spectroscopic properties of a commercial high purity single crystal diamond detector (1 mm^2 area, 500 μm thickness) have been studied using focused ion beams (H, He and C ions) of the MeV energy range. A measured relative energy resolution of 1.3% (FWHM=25 keV) for detection of 2 MeV protons demonstrated useful spectroscopic performance of the CVD diamond device for light ion/atom detection. In order to test diamond radiation hardness the detector was selectively irradiated with 6.5 MeV focused carbon beam up to fluencies of 1011 ions/cm^2. A reliable measurement of ion fluences was accomplished by usage of the microprobe single ion technique – IBIC (ion beam induced charge). After irradiations meant to produce selectively damaged regions in diamond, low current mode IBIC was furthermore used to monitor a degradation of the charge collection efficiency (CCE) and spectroscopic properties of the device. In order to get better overview of the detector performance after irradiation, different ions with ranges smaller, equal and larger than a depth of produced damage were used as IBIC probes. The same experimental procedure of irradiation and IBIC imaging has been performed on a detector grade silicon PIN diode in order to make direct comparison of diamond and silicon material radiation hardness. Contrary to approved radiation hardness of diamond detectors used in high energy physics experiments, presented results show that diamond compared to silicon is less radiation hard for the spectroscopy of short range heavy ions.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
098-1191005-2876 - Procesi interakcije ionskih snopova i nanostrukture (Jakšić, Milko, MZOS ) ( CroRIS)
Ustanove:
Institut "Ruđer Bošković", Zagreb