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Pregled bibliografske jedinice broj: 599814

RELIABILITY ASSESSMENT PROCESS FOR COMPLEX ELECTRONIC SYSTEMS


Kraš, Antun; Mrak, Zoran
RELIABILITY ASSESSMENT PROCESS FOR COMPLEX ELECTRONIC SYSTEMS // Proceeding of the 16th International DAAAM Symposium "Intelligent Manufacturing & Automation: Focus on Young Scientists and Researchers"
Opatija, Hrvatska, 2005. (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)


CROSBI ID: 599814 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
RELIABILITY ASSESSMENT PROCESS FOR COMPLEX ELECTRONIC SYSTEMS

Autori
Kraš, Antun ; Mrak, Zoran

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Proceeding of the 16th International DAAAM Symposium "Intelligent Manufacturing & Automation: Focus on Young Scientists and Researchers" / - , 2005

ISBN
3-901509-46-1

Skup
16th International DAAAM Symposium: “Intelligent Manufacturing and Automation: Focus on Young Researchers and Scientists”

Mjesto i datum
Opatija, Hrvatska, 19.10.2005. - 22.10.2005

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
reliability; durability; failure rate

Sažetak
This paper describes reliability assessment process for complex electronic systems, it contains information on why reliability is required and haw and where the results of the assessment would be used. Two types of assessment are discussed: the similarity analysis and durability analysis. The procedure outlined is aimed at providing reliability analysts, project managers, risk management, designers, safety and reliability engineers and logistic support engineers with a process for estimating the system's instantaneous failure rate.

Izvorni jezik
Engleski

Znanstvena područja
Tehnologija prometa i transport



POVEZANOST RADA


Ustanove:
Pomorski fakultet, Rijeka

Profili:

Avatar Url Antun Kraš (autor)

Avatar Url Zoran Mrak (autor)


Citiraj ovu publikaciju:

Kraš, Antun; Mrak, Zoran
RELIABILITY ASSESSMENT PROCESS FOR COMPLEX ELECTRONIC SYSTEMS // Proceeding of the 16th International DAAAM Symposium "Intelligent Manufacturing & Automation: Focus on Young Scientists and Researchers"
Opatija, Hrvatska, 2005. (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
Kraš, A. & Mrak, Z. (2005) RELIABILITY ASSESSMENT PROCESS FOR COMPLEX ELECTRONIC SYSTEMS. U: Proceeding of the 16th International DAAAM Symposium "Intelligent Manufacturing & Automation: Focus on Young Scientists and Researchers".
@article{article, author = {Kra\v{s}, Antun and Mrak, Zoran}, year = {2005}, keywords = {reliability, durability, failure rate}, isbn = {3-901509-46-1}, title = {RELIABILITY ASSESSMENT PROCESS FOR COMPLEX ELECTRONIC SYSTEMS}, keyword = {reliability, durability, failure rate}, publisherplace = {Opatija, Hrvatska} }
@article{article, author = {Kra\v{s}, Antun and Mrak, Zoran}, year = {2005}, keywords = {reliability, durability, failure rate}, isbn = {3-901509-46-1}, title = {RELIABILITY ASSESSMENT PROCESS FOR COMPLEX ELECTRONIC SYSTEMS}, keyword = {reliability, durability, failure rate}, publisherplace = {Opatija, Hrvatska} }




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