Pregled bibliografske jedinice broj: 588900
The properties of amorphous-nanocrystalline silicon thin films for next generation of solar cells
The properties of amorphous-nanocrystalline silicon thin films for next generation of solar cells // Programme and Book of abstracts JVC 14, EVC 12, AMDVG 11, CROSLOVM 18 / Nikola, Radić ; Slobodan, Milošević (ur.).
Zagreb: Hrvatsko Vakuumsko Društvo (HVD), 2012. str. 45-45 (predavanje, međunarodna recenzija, sažetak, znanstveni)
CROSBI ID: 588900 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
The properties of amorphous-nanocrystalline silicon thin films for next generation of solar cells
Autori
Davor, Gracin ; Krunoslav, Juraić ; Pavo Dubček ; Adam, Marinović ; Sigrid, Bernstorff ; Andrea, Lausi ; Davor, Balzar ; Miran, Čeh
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
Programme and Book of abstracts JVC 14, EVC 12, AMDVG 11, CROSLOVM 18
/ Nikola, Radić ; Slobodan, Milošević - Zagreb : Hrvatsko Vakuumsko Društvo (HVD), 2012, 45-45
Skup
JVC 14, EVC 12, AMDVG 11, CROSLOVM 18
Mjesto i datum
Dubrovnik, Hrvatska, 04.06.2012. - 08.06.2012
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
nano-crystalline silicon; structural and optical properties; solar cells
Sažetak
The optical properties of amorphous-nano-crystalline thin films deposited by Plasma Enhanced Chemical Vapor Deposition (PECVD) were studied in correlation with the size distribution of individual crystal sizes and the crystalline to amorphous fraction. A possible application as active part in solar cells was tested by integrating the actual Si layers in a typical p-i-n solar cell structure. The nano-structural properties were examined by Grazing Incidence Small Angle X-ray Scattering (GISAXS), Wide Angle X-ray scattering (WAXS), Grazing Incidence X-ray Diffraction (GIXRD) and high-resolution electron microscopy (HRTEM). X-ray scattering measurements were done at two beam lines at Synchrotron Elettra, Trieste, the Austrian SAXS and MCX beam lines. The in-depth size distribution of the nano-crystals was found either uniform across the sample, or the crystals were slightly larger when located closer to the surface. Typical sizes were between 4 and 8 nm while the Raman crystal fraction varied from 15 to 40 vol. %. Measurements of the optical properties showed that the spectral distribution of absorption coefficient in a whole range of crystal to amorphous fractions remained similar to pure amorphous silicon in the visible part of the spectrum and showed square dependence on the photon energy (Tauc gap). This implies direct optical transitions for photo generated electrons and holes. The average optical gap was larger for smaller nano-crystals and a higher crystal fraction just confirming the quantum size effects that correspond to quantum dots. The spectral response of solar cells with the examined thin films as active elements showed a narrower spectral distribution and a blue shift comparing to pure amorphous solar cells. The effect was larger for samples with a higher nano-crystal fraction and smaller crystals suggesting a possible application in multi-layer solar cells.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
098-0982886-2894 - Tanki filmovi legura silicija na prijelazu iz amorfne u uređenu strukturu (Gracin, Davor, MZOS ) ( CroRIS)
Ustanove:
Institut "Ruđer Bošković", Zagreb
Profili:
Pavo Dubček
(autor)