Pregled bibliografske jedinice broj: 57238
Micron slices of lead for assessment of alpha particle emission in computer chip manufacturing
Micron slices of lead for assessment of alpha particle emission in computer chip manufacturing // 129th Annual Meeting of the Minerals,Metals, and Materials Society / The Minerals, Metals, and Materials Society (ur.).
Nashville (TN): The Minerals, Metals, and Materials Society, 2000. (predavanje, međunarodna recenzija, sažetak, znanstveni)
CROSBI ID: 57238 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Micron slices of lead for assessment of alpha particle emission in computer chip manufacturing
Autori
Momčilović, Berislav ; Lykken, G.I ; Nitsche, C.
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
129th Annual Meeting of the Minerals,Metals, and Materials Society
/ The Minerals, Metals, and Materials Society - Nashville (TN) : The Minerals, Metals, and Materials Society, 2000
Skup
129th Annual Meeting of the Minerals, Metals, and Materials Society
Mjesto i datum
Nashville (TN), Sjedinjene Američke Države, 07.05.2000. - 12.05.2000
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
lead micron slices; alpha particle emission; computer chip; soft error
Sažetak
Lead micron slices are suitable for the assessment of the risk of alpha particle emission which are the cause of soft error in computer chip manufacturing.
Izvorni jezik
Engleski
Znanstvena područja
Temeljne medicinske znanosti
POVEZANOST RADA
Projekti:
00220108
Ustanove:
Institut za medicinska istraživanja i medicinu rada, Zagreb
Profili:
Berislav Momčilović
(autor)
