Pregled bibliografske jedinice broj: 572249
Assessment of electron mobility in ultra-thin body InGaAs-on-insulator MOSFETs using physics-based modeling
Assessment of electron mobility in ultra-thin body InGaAs-on-insulator MOSFETs using physics-based modeling // IEEE transactions on electron devices, 59 (2012), 6; 1636-1643 doi:10.1109/TED.2012.2189217 (međunarodna recenzija, članak, znanstveni)
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Naslov
Assessment of electron mobility in ultra-thin body InGaAs-on-insulator MOSFETs using physics-based modeling
Autori
Poljak, Mirko ; Jovanović, Vladimir ; Grgec, Dalibor ; Suligoj, Tomislav
Izvornik
IEEE transactions on electron devices (0018-9383) 59
(2012), 6;
1636-1643
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
indium-gallium-arsenide; low-field mobility; physics-based modeling; quantum confinement; ultra-thin body
Sažetak
We have investigated the electron mobility in ultra-thin-body InGaAs-on-insulator devices using physics-based modeling that self-consistently accounts for quantum confinement and covers band structure effects in ultra-thin III-V layers. Scattering by non-polar and polar acoustic and optical phonons, surface roughness and thickness fluctuations, Coulomb and alloy disorder have been included in the calculations. The modeling, calibrated and verified on experimental data from the literature, has revealed a strong influence of thickness fluctuations caused by the light effective mass of Γ valley electrons. Our results indicate that InGaAs-on-insulator MOSFETs are more influenced by interface properties compared to SOI devices and outperform them only above certain body thickness that depends on interface quality.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika
POVEZANOST RADA
Projekti:
036-0361566-1567 - Nanometarski elektronički elementi i sklopovske primjene (Suligoj, Tomislav, MZO ) ( CroRIS)
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb
Profili:
Dalibor Grgec
(autor)
Vladimir Jovanović
(autor)
Tomislav Suligoj
(autor)
Mirko Poljak
(autor)
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus