Pregled bibliografske jedinice broj: 56575
Study of Cu doped semi-insulating GaAs
Study of Cu doped semi-insulating GaAs // Final programme and book of abstracts of the 8th Joint Vacuum Conference of Croatia, Austria, Slovenia and Hungary and 7th Meeting of Croatian and Slovenian Vacuum Scientists / Milun, Milorad ; Zorc, Hrvoje (ur.).
Zagreb: Hrvatsko Vakuumsko Društvo (HVD), 2000. str. 88-88 (poster, međunarodna recenzija, sažetak, znanstveni)
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Naslov
Study of Cu doped semi-insulating GaAs
Autori
Pavlović, Mladen ; Desnica, Uroš ; Zorc, Hrvoje
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
Final programme and book of abstracts of the 8th Joint Vacuum Conference of Croatia, Austria, Slovenia and Hungary and 7th Meeting of Croatian and Slovenian Vacuum Scientists
/ Milun, Milorad ; Zorc, Hrvoje - Zagreb : Hrvatsko Vakuumsko Društvo (HVD), 2000, 88-88
ISBN
953-98154-0-X
Skup
8th Joint Vacuum Conference of Croatia, Austria, Slovenia and Hungar
Mjesto i datum
Pula, Hrvatska, 04.06.2000. - 09.06.2000
Vrsta sudjelovanja
Poster
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
GaAs; impurities; defects
Sažetak
Copper, a common contaminant in semiconductors, was deposited onto unheated semi-insulating (SI) GaAs substrates by high vacuum e-beam method. SI GaAs:Cu, as well as referent undoped SI GaAs were annealed in the same manner, at various temperatures (Ta) in 300-800 K range. Cu diffused into SI GaAs and after each annealing step Thermally Stimulated Current (TSC), dark current (Idark) and photocurrent (Ipc) as well as its temperature dependence were measured and compared. At low annealing temperatures, in GaAs:Cu some TSC peaks, denoted by T1, T4a, T5 and T7, exceeded respective peaks from undoped SL GaAs for approximately 50%, while all other TSC peaks remained unchanged. In both materials at low Ta Idark was governed by the EL2 level, situated 0.75 +/- 0.02 eV below conduction band. For higher Ta in Cu doped sample TSC peaks gradually become dominated by Idark, which got governed by a relatively shallow level with activation energy of 0.15 eV. For annealing temperatures up to 720 K, Ipc (T) was very similar for doped and undoped samples. At higher Ta's, however, in SI GaAs:Cu Ipc decreased for more than four orders of magnitude, with characteristic fast quenching at 90 K. For even higher temperatures, SI GaAs:Cu became conductive. We concluded that Cu influenced some defects in SI GaAs and probably participates in their constitution.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove:
Institut "Ruđer Bošković", Zagreb