Naslov
Compact crystal spectrometers for ion microbeam WDX–PIXE applications

Autori
Tadić, Tonči ; Božičević, Iva ; Jakšić, Milko

Izvornik
X-Ray Spectrometry (0049-8246) 40 (2011), 3; 147-152

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
WDX; PIXE

Sažetak
The use of a CCD for detection of X-rays and a focused or collimated beam of ionising radiation enables the design of a compact, wavelength-dispersive X-ray (WDX) spectrometer, with increased solid angle and tolerable loss of energy resolution. Experimental investigation of WDX spectrometer designs is rather expensive and time consuming, so in order to compare various designs, a numerical X-ray tracing procedure (XTRACE) has been developed for the calculation of instrumental functions and solid angles. XTRACE has been applied to a range of candidate designs for downsized WDX spectrometers with CCD detection and flat, Von Hamos, Johann, Johansson and spherical crystals. Most of the crystal types studied for use in downsized WDX-PIXE spectrometers are sensitive to sample surface rotation, which may affect the reproducibility of experimental conditions. Implications for construction of downsized WDX spectrometers for PIXE application using an ion microbeam are given.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

POVEZANOST RADA