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Pregled bibliografske jedinice broj: 549130

Electro-thermal characterization and simulation of integrated multi-trenched XtreMOS<sup>TM</sup> power devices

Rhayem, J.; Besbes, B.; Blečić, Raul; Bychikhind, S.; Haberfehlnerd, G.; Pogany, D.; Desoete, B.; Gillon, R.; Wieers A.; Tack, M.
Electro-thermal characterization and simulation of integrated multi-trenched XtreMOSTM power devices // Microelectronics journal, 43 (2012), 9; 618-623 doi:10.1016/j.mejo.2011.09.010 (međunarodna recenzija, članak, znanstveni)

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Naslov
Electro-thermal characterization and simulation of integrated multi-trenched XtreMOS<sup>TM</sup> power devices

Autori
Rhayem, J. ; Besbes, B. ; Blečić, Raul ; Bychikhind, S. ; Haberfehlnerd, G. ; Pogany, D. ; Desoete, B. ; Gillon, R. ; Wieers A. ; Tack, M.

Izvornik
Microelectronics journal (0026-2692) 43 (2012), 9; 618-623

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
3D electro-thermal simulation; Integated power devices; SiO<sub>2</sub> trenches

Sažetak
This paper presents a new methodology to characterize and simulate the electro-thermal aspects of packaged power drivers using multi- trenched XtreMOS<sup>TM</sup> devices. Electrical device data is collected by pulsed and DC measurements. Thermal data is collected through on-chip sensors and through a full surface high resolution transient interferometric mapping (TIM). For the first time a data driven segmented electro-thermal transient model is proposed to accurately describe the thermal profile behavior for the mutli-trenched devices. Further investigations of the thermal heating impact on the driver due to the low thermal conductivity of the trenches (SiO<sub>2</sub>) have been carried out. The results of the investigations have been discussed for two different gate to source (VGS) bias conditions: VGS below the temperature compensation point (TCP), which is a bias condition that might lead to a thermal runaway, and VGS above TCP.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika



POVEZANOST RADA

Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb

Profili:

Avatar Url Raul Blečić (autor)

Poveznice na cjeloviti tekst rada:

doi www.sciencedirect.com

Citiraj ovu publikaciju:

Rhayem, J.; Besbes, B.; Blečić, Raul; Bychikhind, S.; Haberfehlnerd, G.; Pogany, D.; Desoete, B.; Gillon, R.; Wieers A.; Tack, M.
Electro-thermal characterization and simulation of integrated multi-trenched XtreMOSTM power devices // Microelectronics journal, 43 (2012), 9; 618-623 doi:10.1016/j.mejo.2011.09.010 (međunarodna recenzija, članak, znanstveni)
Rhayem, J., Besbes, B., Blečić, R., Bychikhind, S., Haberfehlnerd, G., Pogany, D., Desoete, B., Gillon, R., Wieers A. & Tack, M. (2012) Electro-thermal characterization and simulation of integrated multi-trenched XtreMOSTM power devices. Microelectronics journal, 43 (9), 618-623 doi:10.1016/j.mejo.2011.09.010.
@article{article, author = {Rhayem, J. and Besbes, B. and Ble\v{c}i\'{c}, Raul and Bychikhind, S. and Haberfehlnerd, G. and Pogany, D. and Desoete, B. and Gillon, R. and Tack, M.}, year = {2012}, pages = {618-623}, DOI = {10.1016/j.mejo.2011.09.010}, keywords = {3D electro-thermal simulation, Integated power devices, SiO2 trenches}, journal = {Microelectronics journal}, doi = {10.1016/j.mejo.2011.09.010}, volume = {43}, number = {9}, issn = {0026-2692}, title = {Electro-thermal characterization and simulation of integrated multi-trenched XtreMOSTM power devices}, keyword = {3D electro-thermal simulation, Integated power devices, SiO2 trenches} }
@article{article, author = {Rhayem, J. and Besbes, B. and Ble\v{c}i\'{c}, Raul and Bychikhind, S. and Haberfehlnerd, G. and Pogany, D. and Desoete, B. and Gillon, R. and Tack, M.}, year = {2012}, pages = {618-623}, DOI = {10.1016/j.mejo.2011.09.010}, keywords = {3D electro-thermal simulation, Integated power devices, SiO2 trenches}, journal = {Microelectronics journal}, doi = {10.1016/j.mejo.2011.09.010}, volume = {43}, number = {9}, issn = {0026-2692}, title = {Electro-thermal characterization and simulation of integrated multi-trenched XtreMOSTM power devices}, keyword = {3D electro-thermal simulation, Integated power devices, SiO2 trenches} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI

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