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Pregled bibliografske jedinice broj: 539181

Examination of Novel High-voltage Double-emitter Horizontal Current Bipolar Transistor (HCBT)


Koričić, Marko; Suligoj, Tomislav; Mochizuki, Hidenori; Morita, So-ichi; Shinomura, Katsumi; Imai, Hisaya
Examination of Novel High-voltage Double-emitter Horizontal Current Bipolar Transistor (HCBT) // Proceedings of the 2011 Bipolar/BiCMOS Circuits and Technology Meeting
Atlanta (GA), Sjedinjene Američke Države: Institute of Electrical and Electronics Engineers (IEEE), 2011. str. 5-8 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)


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Naslov
Examination of Novel High-voltage Double-emitter Horizontal Current Bipolar Transistor (HCBT)

Autori
Koričić, Marko ; Suligoj, Tomislav ; Mochizuki, Hidenori ; Morita, So-ichi ; Shinomura, Katsumi ; Imai, Hisaya

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Proceedings of the 2011 Bipolar/BiCMOS Circuits and Technology Meeting / - : Institute of Electrical and Electronics Engineers (IEEE), 2011, 5-8

ISBN
978-1-61284-163-2

Skup
Bipolar/BiCMOS Circuits and Technology Meeting

Mjesto i datum
Atlanta (GA), Sjedinjene Američke Države, 09.10.2011. - 11.10.2011

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
BiCMOS integrirani sklopovi; elektronički elementi snage; elektrostatska zaštita baze; Tranzistor s horizontalnim tokom struje; fizika elektroničkih elemenata
(BiCMOS integrated circuits; power devices; base shielding effect; Horizontal Current Bipolar Transistor; device physics)

Sažetak
Electrical characteristics of a novel high-voltage double emitter HCBT structure integrated with the standard 180 nm bulk CMOS are presented. 3D collector charge sharing is used to achieve intrinsic base shielding and to limit the electric field across the intrinsic base-collector junction. This is accomplished by the transistor layout i.e. the mask design. Transistors with BVCEO =12.6 V, VA=301 V and fT=12.7 GHz are fabricated in a standard HCBT BiCMOS process flow without the use of the additional lithography masks. Physical behavior of the transistor is thoroughly examined by 3D device simulations

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika



POVEZANOST RADA


Projekti:
036-0361566-1567 - Nanometarski elektronički elementi i sklopovske primjene (Suligoj, Tomislav, MZO ) ( CroRIS)
036-0982904-1642 - Sofisticirane poluvodičke strukture za komunikacijsku tehnologiju (Koričić, Marko, MZO ) ( CroRIS)

Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb

Profili:

Avatar Url Marko Koričić (autor)

Avatar Url Tomislav Suligoj (autor)


Citiraj ovu publikaciju:

Koričić, Marko; Suligoj, Tomislav; Mochizuki, Hidenori; Morita, So-ichi; Shinomura, Katsumi; Imai, Hisaya
Examination of Novel High-voltage Double-emitter Horizontal Current Bipolar Transistor (HCBT) // Proceedings of the 2011 Bipolar/BiCMOS Circuits and Technology Meeting
Atlanta (GA), Sjedinjene Američke Države: Institute of Electrical and Electronics Engineers (IEEE), 2011. str. 5-8 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
Koričić, M., Suligoj, T., Mochizuki, H., Morita, S., Shinomura, K. & Imai, H. (2011) Examination of Novel High-voltage Double-emitter Horizontal Current Bipolar Transistor (HCBT). U: Proceedings of the 2011 Bipolar/BiCMOS Circuits and Technology Meeting.
@article{article, author = {Kori\v{c}i\'{c}, Marko and Suligoj, Tomislav and Mochizuki, Hidenori and Morita, So-ichi and Shinomura, Katsumi and Imai, Hisaya}, year = {2011}, pages = {5-8}, keywords = {BiCMOS integrirani sklopovi, elektroni\v{c}ki elementi snage, elektrostatska za\v{s}tita baze, Tranzistor s horizontalnim tokom struje, fizika elektroni\v{c}kih elemenata}, isbn = {978-1-61284-163-2}, title = {Examination of Novel High-voltage Double-emitter Horizontal Current Bipolar Transistor (HCBT)}, keyword = {BiCMOS integrirani sklopovi, elektroni\v{c}ki elementi snage, elektrostatska za\v{s}tita baze, Tranzistor s horizontalnim tokom struje, fizika elektroni\v{c}kih elemenata}, publisher = {Institute of Electrical and Electronics Engineers (IEEE)}, publisherplace = {Atlanta (GA), Sjedinjene Ameri\v{c}ke Dr\v{z}ave} }
@article{article, author = {Kori\v{c}i\'{c}, Marko and Suligoj, Tomislav and Mochizuki, Hidenori and Morita, So-ichi and Shinomura, Katsumi and Imai, Hisaya}, year = {2011}, pages = {5-8}, keywords = {BiCMOS integrated circuits, power devices, base shielding effect, Horizontal Current Bipolar Transistor, device physics}, isbn = {978-1-61284-163-2}, title = {Examination of Novel High-voltage Double-emitter Horizontal Current Bipolar Transistor (HCBT)}, keyword = {BiCMOS integrated circuits, power devices, base shielding effect, Horizontal Current Bipolar Transistor, device physics}, publisher = {Institute of Electrical and Electronics Engineers (IEEE)}, publisherplace = {Atlanta (GA), Sjedinjene Ameri\v{c}ke Dr\v{z}ave} }




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