Pregled bibliografske jedinice broj: 539181
Examination of Novel High-voltage Double-emitter Horizontal Current Bipolar Transistor (HCBT)
Examination of Novel High-voltage Double-emitter Horizontal Current Bipolar Transistor (HCBT) // Proceedings of the 2011 Bipolar/BiCMOS Circuits and Technology Meeting
Atlanta (GA), Sjedinjene Američke Države: Institute of Electrical and Electronics Engineers (IEEE), 2011. str. 5-8 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
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Naslov
Examination of Novel High-voltage Double-emitter Horizontal Current Bipolar Transistor (HCBT)
Autori
Koričić, Marko ; Suligoj, Tomislav ; Mochizuki, Hidenori ; Morita, So-ichi ; Shinomura, Katsumi ; Imai, Hisaya
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
Proceedings of the 2011 Bipolar/BiCMOS Circuits and Technology Meeting
/ - : Institute of Electrical and Electronics Engineers (IEEE), 2011, 5-8
ISBN
978-1-61284-163-2
Skup
Bipolar/BiCMOS Circuits and Technology Meeting
Mjesto i datum
Atlanta (GA), Sjedinjene Američke Države, 09.10.2011. - 11.10.2011
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
BiCMOS integrirani sklopovi; elektronički elementi snage; elektrostatska zaštita baze; Tranzistor s horizontalnim tokom struje; fizika elektroničkih elemenata
(BiCMOS integrated circuits; power devices; base shielding effect; Horizontal Current Bipolar Transistor; device physics)
Sažetak
Electrical characteristics of a novel high-voltage double emitter HCBT structure integrated with the standard 180 nm bulk CMOS are presented. 3D collector charge sharing is used to achieve intrinsic base shielding and to limit the electric field across the intrinsic base-collector junction. This is accomplished by the transistor layout i.e. the mask design. Transistors with BVCEO =12.6 V, VA=301 V and fT=12.7 GHz are fabricated in a standard HCBT BiCMOS process flow without the use of the additional lithography masks. Physical behavior of the transistor is thoroughly examined by 3D device simulations
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika
POVEZANOST RADA
Projekti:
036-0361566-1567 - Nanometarski elektronički elementi i sklopovske primjene (Suligoj, Tomislav, MZO ) ( CroRIS)
036-0982904-1642 - Sofisticirane poluvodičke strukture za komunikacijsku tehnologiju (Koričić, Marko, MZO ) ( CroRIS)
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb