Pregled bibliografske jedinice broj: 53813
Microhardness characterization of Al-W thin films
Microhardness characterization of Al-W thin films // Final Programme and Book of Abstracts, ISBN: 953-98154-0-x / Milun, Milorad ; Zorc, Hrvoje (ur.).
Zagreb: Hrvatsko Vakuumsko Društvo (HVD), 2000. str. 94-94 (predavanje, međunarodna recenzija, sažetak, znanstveni)
CROSBI ID: 53813 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Microhardness characterization of Al-W thin films
Autori
Stubičar, Mirko ; Tonejc, Antun ; Radić, Nikola
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
Final Programme and Book of Abstracts, ISBN: 953-98154-0-x
/ Milun, Milorad ; Zorc, Hrvoje - Zagreb : Hrvatsko Vakuumsko Društvo (HVD), 2000, 94-94
Skup
8th Joint Vacuum Conference of Croatia, Austria, Slovenia and Hungary and 7th Meeting of Croatia and Slovenia Vacuum Scientists
Mjesto i datum
Pula, Hrvatska, 04.06.2000. - 09.06.2000
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
Al-W tanki filmovi; Magnetronska kodepozicija; Rentgenska difrakcija; Vickersova mikrotvrdoća; Toplinska obrada.
(Al-W thin films; Magnetron cosputtering; X-ray diffraction; Vickers microhardness meassurements; Heat treatment.)
Sažetak
Binary alloys of aluminum and tungsten are interesting because of various possible engineering applications, e.g. as a corrosion resistant coating or as a difussion barrier layer at higher temperatures, etc. Thin films of Al-W alloys (Al82W18 to Al50W50), were prepared on the sapphire or alumina substrates by magnetron cosputtering technique. It is revealed by X-ray diffraction that films inside a composition range Al82W18 to Al62W38 are amorphous, while further addition of tungsten resulted in a small fraction of crystalline W phase within a dominant amorphous phase. Vickers microhardness measurements at room temperature were performed on the as-prepared and annealed Al-W thin films to characterize their mechanical behaviour and to correlate it with microstructural changes. Microhardness values on the films varied from about 8-10 GPa for completely amorphous films, up to 20 GPa for two-phase films. Main reason for this increase is probably a presence of a minor fraction of crystalline tungsten phase, beside dominant amorphous one. Experiments dealing with the effects of annealing conditions during heat-treatment upon microhardness and structural changes are in progress.
Izvorni jezik
Hrvatski
Znanstvena područja
Fizika, Kemija
POVEZANOST RADA
Ustanove:
Institut "Ruđer Bošković", Zagreb,
Prirodoslovno-matematički fakultet, Zagreb