Pregled bibliografske jedinice broj: 502147
Analysis of Factors that Influence Micro-Resistance Measuring
Analysis of Factors that Influence Micro-Resistance Measuring // Strojarstvo, 52 (2010), 3; 261-270 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 502147 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Analysis of Factors that Influence Micro-Resistance Measuring
Autori
Banovac, Eraldo ; Kozak, Dražan
Izvornik
Strojarstvo (0562-1887) 52
(2010), 3;
261-270
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
dispersion analysis; micro-resistance measuring method; plated-through hole; thickness measuring
Sažetak
The micro-resistance measuring principle with specific forms of current distribution in the plated through-hole of printed circuit board (PCB) is analyzed in this paper. Special attention is paid to the following factors that influence the micro-resistance measuring: the hole diameter, the type of the measuring probe and the PCB thickness, and their two and three-factor interactions. The experiment with three repetition of measurement is carried out for which the dispersion analysis includes: the calculated values of the sum of the square of deviation, the mean of the square of deviation and a comparison between the calculated factors and the relevant factor given for five percent α-risk. The results of the dispersion analysis clearly indicate that the strongest factor that influences the micro-resistance measures is the PCB thickness. The overall conclusion is that the effect of each considered factor to the micro-resistance measures is expressive, but the effect of their mutual interactions is not significant in the measuring practice.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika, Strojarstvo
POVEZANOST RADA
Projekti:
152-1201910-1909 - Analiza i procjena loma konstrukcija iz anizotropnih materijala (Kozak, Dražan, MZOS ) ( CroRIS)
Ustanove:
Strojarski fakultet, Slavonski Brod
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
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