Naslov
Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry

Autori
Barroso, F. ; Bosch, S. ; Tort, N. ; Arteaga, O. ; Sancho-Parramon, Jordi ; Jover, E. ; Bertran, E. ; Canillas, A.

Izvornik
Thin solid films (0040-6090) 519 (2011), 9; 2801-2805

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
nanoparticles; scattering; ellipsometry

Sažetak
We introduce a new measurement system called Nanopolar interferometer devoted to monitor and characterize single nanoparticles which is based on the interferometric phase modulated ellipsometry technique. The system collects the backscattered light by the particles in the solid angle subtended by a microscope objective and then analyses its frequency components. The results for the detection of 2 μm and 50 nm particles are explained in terms of a cross polarization effect of the polarization vectors when the beam converts from divergent to parallel in the microscope objective. This explanation is supported with the results of the optical modelling using the exact Mie theory for the light scattered by the particles.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

Napomena
Rad je prezentiran na skupu 5th International Conference on Spectroscopic Ellipsometry (ICSE-V).

POVEZANOST RADA