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Pregled bibliografske jedinice broj: 493781

Measurement Equivalence of the Dispositional Resistance to Change Scale


Oreg, Shaul; Bayazit, Mahmut; Vakola, Maria; Arciniega, Luis; Armenakis, Achilles; Barkauskiene, Rasa; Bozionelos, Nikos; Fujimoto, Yuka; González, Luis; Han, Jian et al.
Measurement Equivalence of the Dispositional Resistance to Change Scale // Cross-Cultural Analysis: Methods and Applications / Davidov, Eldad ; Schmidt, Peter ; Billiet, Jaak (ur.).
New York (NY): Routledge, 2011. str. 249-278


CROSBI ID: 493781 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Measurement Equivalence of the Dispositional Resistance to Change Scale

Autori
Oreg, Shaul ; Bayazit, Mahmut ; Vakola, Maria ; Arciniega, Luis ; Armenakis, Achilles ; Barkauskiene, Rasa ; Bozionelos, Nikos ; Fujimoto, Yuka ; González, Luis ; Han, Jian ; Hrebícková, Martina ; Jimmieson, Nerina ; Kordacová, Jana ; Mitsuhashi, Hitoshi ; Mlačić, Boris ; Ferić, Ivana ; Kotrla Topić, Marina ; Ohly, Sandra ; Saksvik, Per Oystein ; Hetland, Hilde ; Saksvik, Ingvild ; van Dam, Karen

Vrsta, podvrsta i kategorija rada
Poglavlja u knjigama, znanstveni

Knjiga
Cross-Cultural Analysis: Methods and Applications

Urednik/ci
Davidov, Eldad ; Schmidt, Peter ; Billiet, Jaak

Izdavač
Routledge

Grad
New York (NY)

Godina
2011

Raspon stranica
249-278

ISBN
978-1-84872-823-3

Ključne riječi
resistance to change, measurement equivalence, confirmatory smallest space analysis, multi-group confirmatory factor analysis

Sažetak
Intended to bridge the gap between the latest methodological developments and cross-cultural research, this interdisciplinary resource presents the latest strategies for analyzing cross-cultural data. Techniques are demonstrated through the use of applications that employ cross national data sets. With an emphasis on the generalized latent variable approach, internationally–prominent researchers from a variety of fields explain how the methods work, how to apply them, and how they relate to other methods presented in the book. Chapter 9, "Measurement Equivalence of the Dispositional Resistance to Change Scale", by Shaul Oreg and colleagues uses confirmatory smallest space analysis (SSA) as a complementary technique to multi-group confirmatory factor analysis (MGCFA). The authors use samples from 17 countries, representing 13 languages and four continents, to validate the resistance to change scale across these nations. Each of the methods used is based on a separate set of assumptions, and each offers a separate set of advantages. Results from the two analyses serve to validate one another, and together provide strong support for the RTC scale’s structure across cultural contexts. It is recommended that future work take on similar procedures, employing distinct analytic techniques, for the validation of other constructs as well.

Izvorni jezik
Engleski

Znanstvena područja
Sociologija, Psihologija



POVEZANOST RADA


Projekti:
194-1941558-1523 - Istraživanje javnoga mnijenja i masovnih medija (Ferić, Ivana, MZOS ) ( CroRIS)
194-1941558-1530 - Osobine ličnosti, prirodni jezik i kognitivni razvoj (Mlačić, Boris, MZOS ) ( CroRIS)

Ustanove:
Institut društvenih znanosti Ivo Pilar, Zagreb

Profili:

Avatar Url Boris Mlačić (autor)

Avatar Url Marina Kotrla Topić (autor)

Avatar Url Ivana Ferić (autor)


Citiraj ovu publikaciju:

Oreg, Shaul; Bayazit, Mahmut; Vakola, Maria; Arciniega, Luis; Armenakis, Achilles; Barkauskiene, Rasa; Bozionelos, Nikos; Fujimoto, Yuka; González, Luis; Han, Jian et al.
Measurement Equivalence of the Dispositional Resistance to Change Scale // Cross-Cultural Analysis: Methods and Applications / Davidov, Eldad ; Schmidt, Peter ; Billiet, Jaak (ur.).
New York (NY): Routledge, 2011. str. 249-278
Oreg, S., Bayazit, M., Vakola, M., Arciniega, L., Armenakis, A., Barkauskiene, R., Bozionelos, N., Fujimoto, Y., González, L. & Han, J. (2011) Measurement Equivalence of the Dispositional Resistance to Change Scale. U: Davidov, E., Schmidt, P. & Billiet, J. (ur.) Cross-Cultural Analysis: Methods and Applications. New York (NY), Routledge, str. 249-278.
@inbook{inbook, author = {Oreg, Shaul and Bayazit, Mahmut and Vakola, Maria and Arciniega, Luis and Armenakis, Achilles and Barkauskiene, Rasa and Bozionelos, Nikos and Fujimoto, Yuka and Gonz\'{a}lez, Luis and Han, Jian and Hreb\'{\i}ckov\'{a}, Martina and Jimmieson, Nerina and Kordacov\'{a}, Jana and Mitsuhashi, Hitoshi and Mla\v{c}i\'{c}, Boris and Feri\'{c}, Ivana and Kotrla Topi\'{c}, Marina and Ohly, Sandra and Saksvik, Per Oystein and Hetland, Hilde and Saksvik, Ingvild and van Dam, Karen}, year = {2011}, pages = {249-278}, keywords = {resistance to change, measurement equivalence, confirmatory smallest space analysis, multi-group confirmatory factor analysis}, isbn = {978-1-84872-823-3}, title = {Measurement Equivalence of the Dispositional Resistance to Change Scale}, keyword = {resistance to change, measurement equivalence, confirmatory smallest space analysis, multi-group confirmatory factor analysis}, publisher = {Routledge}, publisherplace = {New York (NY)} }
@inbook{inbook, author = {Oreg, Shaul and Bayazit, Mahmut and Vakola, Maria and Arciniega, Luis and Armenakis, Achilles and Barkauskiene, Rasa and Bozionelos, Nikos and Fujimoto, Yuka and Gonz\'{a}lez, Luis and Han, Jian and Hreb\'{\i}ckov\'{a}, Martina and Jimmieson, Nerina and Kordacov\'{a}, Jana and Mitsuhashi, Hitoshi and Mla\v{c}i\'{c}, Boris and Feri\'{c}, Ivana and Kotrla Topi\'{c}, Marina and Ohly, Sandra and Saksvik, Per Oystein and Hetland, Hilde and Saksvik, Ingvild and van Dam, Karen}, year = {2011}, pages = {249-278}, keywords = {resistance to change, measurement equivalence, confirmatory smallest space analysis, multi-group confirmatory factor analysis}, isbn = {978-1-84872-823-3}, title = {Measurement Equivalence of the Dispositional Resistance to Change Scale}, keyword = {resistance to change, measurement equivalence, confirmatory smallest space analysis, multi-group confirmatory factor analysis}, publisher = {Routledge}, publisherplace = {New York (NY)} }




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