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Pregled bibliografske jedinice broj: 470026

Parametric Rietveld refinement for the evaluation of powder diffraction patterns collected as a function of pressure


Halasz, Ivan; Dinnebier, Robert E.; Angel, Ross
Parametric Rietveld refinement for the evaluation of powder diffraction patterns collected as a function of pressure // Journal of applied crystallography, 43 (2010), 3; 504-510 doi:10.1107/S0021889810005856 (međunarodna recenzija, članak, znanstveni)


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Naslov
Parametric Rietveld refinement for the evaluation of powder diffraction patterns collected as a function of pressure

Autori
Halasz, Ivan ; Dinnebier, Robert E. ; Angel, Ross

Izvornik
Journal of applied crystallography (0021-8898) 43 (2010), 3; 504-510

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
parametric Rietveld refinement ; powder diffraction ; pressure

Sažetak
Under the assumption that the structural parameters of a crystalline phase change 'smoothly' with increasing pressure, the evolution of the parameters can be parameterized as a function of pressure using continuous monotonic functions. Four different approaches to determine the structural evolution of As2O5 with increasing pressure from a set of powder diffraction patterns collected over the pressure range from 2.5 to 19.5 GPa have been investigated. Approach (A) was the common sequential refinement of atomic coordinates with restraints on the geometry and was compared with three parameterization approaches. Approach (B) used direct parameterization by low-order polynomials of each crystallographically distinct atomic coordinate, (C) described the atoms of the asymmetric unit as a rigid body and allowed the internal degrees of freedom of the rigid body to vary with the change in pressure using rigid unit modes, and (D) described the crystal structure as a distortion of the higher-symmetry structure of As2O5 (which is here also a high-temperature phase) by using symmetry-adapted distortion modes. Approach (D) offers the possibility to directly introduce an order parameter into Rietveld refinement through an empirical power law derived from Landau theory and thus to obtain the value of the critical exponent. In contrast, the rigid-body approach did not fit the data as well. All parameterizations greatly reduce the number of required parameters.

Izvorni jezik
Engleski

Znanstvena područja
Kemija



POVEZANOST RADA


Ustanove:
Prirodoslovno-matematički fakultet, Zagreb

Profili:

Avatar Url Ivan Halasz (autor)

Poveznice na cjeloviti tekst rada:

doi onlinelibrary.wiley.com

Citiraj ovu publikaciju:

Halasz, Ivan; Dinnebier, Robert E.; Angel, Ross
Parametric Rietveld refinement for the evaluation of powder diffraction patterns collected as a function of pressure // Journal of applied crystallography, 43 (2010), 3; 504-510 doi:10.1107/S0021889810005856 (međunarodna recenzija, članak, znanstveni)
Halasz, I., Dinnebier, R. & Angel, R. (2010) Parametric Rietveld refinement for the evaluation of powder diffraction patterns collected as a function of pressure. Journal of applied crystallography, 43 (3), 504-510 doi:10.1107/S0021889810005856.
@article{article, author = {Halasz, Ivan and Dinnebier, Robert E. and Angel, Ross}, year = {2010}, pages = {504-510}, DOI = {10.1107/S0021889810005856}, keywords = {parametric Rietveld refinement, powder diffraction, pressure}, journal = {Journal of applied crystallography}, doi = {10.1107/S0021889810005856}, volume = {43}, number = {3}, issn = {0021-8898}, title = {Parametric Rietveld refinement for the evaluation of powder diffraction patterns collected as a function of pressure}, keyword = {parametric Rietveld refinement, powder diffraction, pressure} }
@article{article, author = {Halasz, Ivan and Dinnebier, Robert E. and Angel, Ross}, year = {2010}, pages = {504-510}, DOI = {10.1107/S0021889810005856}, keywords = {parametric Rietveld refinement, powder diffraction, pressure}, journal = {Journal of applied crystallography}, doi = {10.1107/S0021889810005856}, volume = {43}, number = {3}, issn = {0021-8898}, title = {Parametric Rietveld refinement for the evaluation of powder diffraction patterns collected as a function of pressure}, keyword = {parametric Rietveld refinement, powder diffraction, pressure} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Citati:





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