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Pregled bibliografske jedinice broj: 46577

IBIC characterisation of defect structures in polycrystalline silicon

Jakšić, Milko; Pastuović, Željko; Pivac, Branko; Borjanović, Vesna
IBIC characterisation of defect structures in polycrystalline silicon // 7th International Conference on Nuclear Microprobe Technology and Applications, Final Program and Abstracts
Bordeaux: ICNMTA 2000, 2000. str. 33-33 (predavanje, nije recenziran, sažetak, znanstveni)

CROSBI ID: 46577 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
IBIC characterisation of defect structures in polycrystalline silicon

Autori
Jakšić, Milko ; Pastuović, Željko ; Pivac, Branko ; Borjanović, Vesna

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
7th International Conference on Nuclear Microprobe Technology and Applications, Final Program and Abstracts / - Bordeaux : ICNMTA 2000, 2000, 33-33

Skup
7th International Conference on Nuclear Microprobe Technology and Applications

Mjesto i datum
Bordeaux, Francuska, 10.09.2000. - 15.09.2000

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Nije recenziran

Ključne riječi
polycrystalline silicon

Sažetak
The physics of silicon solar cell device imposes very stringent requirements on the electrical properties of material. A pressure to lower the cost of the substance brings the novel material to be processed with a fairly inexpensive techology.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA

Projekti:
00980206

Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb,
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Milko Jakšić (autor)

Avatar Url Branko Pivac (autor)

Avatar Url Vesna Borjanović (autor)

Avatar Url Željko Pastuović (autor)

Citiraj ovu publikaciju:

Jakšić, Milko; Pastuović, Željko; Pivac, Branko; Borjanović, Vesna
IBIC characterisation of defect structures in polycrystalline silicon // 7th International Conference on Nuclear Microprobe Technology and Applications, Final Program and Abstracts
Bordeaux: ICNMTA 2000, 2000. str. 33-33 (predavanje, nije recenziran, sažetak, znanstveni)
Jakšić, M., Pastuović, Ž., Pivac, B. & Borjanović, V. (2000) IBIC characterisation of defect structures in polycrystalline silicon. U: 7th International Conference on Nuclear Microprobe Technology and Applications, Final Program and Abstracts.
@article{article, author = {Jak\v{s}i\'{c}, Milko and Pastuovi\'{c}, \v{Z}eljko and Pivac, Branko and Borjanovi\'{c}, Vesna}, year = {2000}, pages = {33-33}, keywords = {polycrystalline silicon}, title = {IBIC characterisation of defect structures in polycrystalline silicon}, keyword = {polycrystalline silicon}, publisher = {ICNMTA 2000}, publisherplace = {Bordeaux, Francuska} }
@article{article, author = {Jak\v{s}i\'{c}, Milko and Pastuovi\'{c}, \v{Z}eljko and Pivac, Branko and Borjanovi\'{c}, Vesna}, year = {2000}, pages = {33-33}, keywords = {polycrystalline silicon}, title = {IBIC characterisation of defect structures in polycrystalline silicon}, keyword = {polycrystalline silicon}, publisher = {ICNMTA 2000}, publisherplace = {Bordeaux, Francuska} }

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