Pregled bibliografske jedinice broj: 456035
X-ray diffraction examination of structure and stability of amorphous Cu--W thin films
X-ray diffraction examination of structure and stability of amorphous Cu--W thin films // Material Science Forum, 133-136 (1993), 913-919 (podatak o recenziji nije dostupan, članak, znanstveni)
CROSBI ID: 456035 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
X-ray diffraction examination of structure and stability of amorphous Cu--W thin films
Autori
Gržeta, Biserka ; Radić, Nikola ; Gracin, Davor ; Došlić, Tomislav
Izvornik
Material Science Forum (0255-5476) 133-136
(1993);
913-919
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
amorphous alloys; thin films
Sažetak
Detailed studies of the structure of the amorphous Cu - W thin films deposited by magnetron sputtering have been performed by X-ray diffraction at 300 K.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove:
Građevinski fakultet, Zagreb
