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Pregled bibliografske jedinice broj: 455117

Barrier and semiconducting properties of thin anodic films on Cr in an acid solution


Petrović, Željka; Lajci, Nushe; Metikoš-Huković, Mirjana; Babić, Ranko
Barrier and semiconducting properties of thin anodic films on Cr in an acid solution // Journal of solid state electrochemistry, 15 (2011), 6; 1201-1207 doi:10.1007/s10008-010-1192-8 (međunarodna recenzija, članak, znanstveni)


CROSBI ID: 455117 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Barrier and semiconducting properties of thin anodic films on Cr in an acid solution

Autori
Petrović, Željka ; Lajci, Nushe ; Metikoš-Huković, Mirjana ; Babić, Ranko

Izvornik
Journal of solid state electrochemistry (1432-8488) 15 (2011), 6; 1201-1207

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
chromium-quartz crystal electrode; chromium hydrated oxide; low-field mechanism; n-type semiconductor; diffusion coefficient of anion vacancies

Sažetak
The study of barrier and semiconducting properties of anodically formed oxide films on chromium in an acid solution was carried out using the Cr-quartz crystal electrode. The oxide film formation and growth occur through an anion vacancies transport via a low-field assisted mechanism (H = 10^6 V cm^(-1)). The anion diffusion coefficient, which quantitatively describes the transport of point defects within the growing film, was calculated using the Cottrell equation and from capacitance data using the Nernst-Planck for low-field limit approximation and Mott-Schottky analysis. The depletion region in the passive film, close to the filmelectrolyte interface, dominates the semiconducting properties. The passive film on Cr in an acid solution behaves as an n-type semiconductor. An energy-band structure model of the passive film is given.

Izvorni jezik
Engleski

Znanstvena područja
Kemija



POVEZANOST RADA


Projekti:
125-0982904-2923 - Novi materijali i katalizatori za održive tehnologije (Metikoš-Huković, Mirjana, MZOS ) ( CroRIS)

Ustanove:
Fakultet kemijskog inženjerstva i tehnologije, Zagreb

Poveznice na cjeloviti tekst rada:

doi dx.doi.org www.springerlink.com

Citiraj ovu publikaciju:

Petrović, Željka; Lajci, Nushe; Metikoš-Huković, Mirjana; Babić, Ranko
Barrier and semiconducting properties of thin anodic films on Cr in an acid solution // Journal of solid state electrochemistry, 15 (2011), 6; 1201-1207 doi:10.1007/s10008-010-1192-8 (međunarodna recenzija, članak, znanstveni)
Petrović, Ž., Lajci, N., Metikoš-Huković, M. & Babić, R. (2011) Barrier and semiconducting properties of thin anodic films on Cr in an acid solution. Journal of solid state electrochemistry, 15 (6), 1201-1207 doi:10.1007/s10008-010-1192-8.
@article{article, author = {Petrovi\'{c}, \v{Z}eljka and Lajci, Nushe and Metiko\v{s}-Hukovi\'{c}, Mirjana and Babi\'{c}, Ranko}, year = {2011}, pages = {1201-1207}, DOI = {10.1007/s10008-010-1192-8}, keywords = {chromium-quartz crystal electrode, chromium hydrated oxide, low-field mechanism, n-type semiconductor, diffusion coefficient of anion vacancies}, journal = {Journal of solid state electrochemistry}, doi = {10.1007/s10008-010-1192-8}, volume = {15}, number = {6}, issn = {1432-8488}, title = {Barrier and semiconducting properties of thin anodic films on Cr in an acid solution}, keyword = {chromium-quartz crystal electrode, chromium hydrated oxide, low-field mechanism, n-type semiconductor, diffusion coefficient of anion vacancies} }
@article{article, author = {Petrovi\'{c}, \v{Z}eljka and Lajci, Nushe and Metiko\v{s}-Hukovi\'{c}, Mirjana and Babi\'{c}, Ranko}, year = {2011}, pages = {1201-1207}, DOI = {10.1007/s10008-010-1192-8}, keywords = {chromium-quartz crystal electrode, chromium hydrated oxide, low-field mechanism, n-type semiconductor, diffusion coefficient of anion vacancies}, journal = {Journal of solid state electrochemistry}, doi = {10.1007/s10008-010-1192-8}, volume = {15}, number = {6}, issn = {1432-8488}, title = {Barrier and semiconducting properties of thin anodic films on Cr in an acid solution}, keyword = {chromium-quartz crystal electrode, chromium hydrated oxide, low-field mechanism, n-type semiconductor, diffusion coefficient of anion vacancies} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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