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Pregled bibliografske jedinice broj: 449366

Direct observation of defects in hexagonal boron nitride by near- edge X-ray absorption fine structure and X-ray photoemission spectroscopy

Petravić, Mladen; Peter, Robert; Fan, Liang-Jen; Yang, Yaw-Wen; Chen, Ying
Direct observation of defects in hexagonal boron nitride by near- edge X-ray absorption fine structure and X-ray photoemission spectroscopy // Nuclear Instruments and Methods in Physics Research. A, 619 (2010), 1/3; 94-97 doi:10.1016/j.nima.2009.10.118 (međunarodna recenzija, članak, znanstveni)

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Naslov
Direct observation of defects in hexagonal boron nitride by near- edge X-ray absorption fine structure and X-ray photoemission spectroscopy

Autori
Petravić, Mladen ; Peter, Robert ; Fan, Liang-Jen ; Yang, Yaw-Wen ; Chen, Ying

Izvornik
Nuclear Instruments and Methods in Physics Research. A (0168-9002) 619 (2010), 1/3; 94-97

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
boron nitride; NEXAFS; XPS; point defects

Sažetak
Formation of defects in hexagonal boron nitride (h-BN) under low-energy argon or nitrogen ion bombardment has been studied by near-edge X-ray absorption fine structure (NEXAFS) around boron and nitrogen K-edges and X-ray photoemission spectroscopy (XPS) from B1s and N1s core levels. Breaking of B–N bonds and formation of nitrogen vacancies have been identified in the B K-edge NEXAFS and B1s XPS measurements, followed by the formation of molecular nitrogen, N2, at interstitial positions for both argon and nitrogen bombardments. The formation of N2 produces a sharp resonance in the low-resolution NEXAFS spectra around the N K-edge, showing characteristic vibrational fine structure in high-resolution measurements.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

Napomena
Rad je prezentiran na skupu 11th International Symposium on Radiation Physics : Frontiers in radiation physics and applications.



POVEZANOST RADA

Projekti:
316-0982886-0542 - Istraživanje dušikovih defekata u složenim poluvodičkim spojevima (Petravić, Mladen, MZOS ) ( CroRIS)

Ustanove:
Sveučilište u Rijeci - Odjel za fiziku

Profili:

Avatar Url Mladen Petravić (autor)

Avatar Url Robert Peter (autor)

Poveznice na cjeloviti tekst rada:

doi www.sciencedirect.com ac.els-cdn.com dx.doi.org

Citiraj ovu publikaciju:

Petravić, Mladen; Peter, Robert; Fan, Liang-Jen; Yang, Yaw-Wen; Chen, Ying
Direct observation of defects in hexagonal boron nitride by near- edge X-ray absorption fine structure and X-ray photoemission spectroscopy // Nuclear Instruments and Methods in Physics Research. A, 619 (2010), 1/3; 94-97 doi:10.1016/j.nima.2009.10.118 (međunarodna recenzija, članak, znanstveni)
Petravić, M., Peter, R., Fan, L., Yang, Y. & Chen, Y. (2010) Direct observation of defects in hexagonal boron nitride by near- edge X-ray absorption fine structure and X-ray photoemission spectroscopy. Nuclear Instruments and Methods in Physics Research. A, 619 (1/3), 94-97 doi:10.1016/j.nima.2009.10.118.
@article{article, author = {Petravi\'{c}, Mladen and Peter, Robert and Fan, Liang-Jen and Yang, Yaw-Wen and Chen, Ying}, year = {2010}, pages = {94-97}, DOI = {10.1016/j.nima.2009.10.118}, keywords = {boron nitride, NEXAFS, XPS, point defects}, journal = {Nuclear Instruments and Methods in Physics Research. A}, doi = {10.1016/j.nima.2009.10.118}, volume = {619}, number = {1/3}, issn = {0168-9002}, title = {Direct observation of defects in hexagonal boron nitride by near- edge X-ray absorption fine structure and X-ray photoemission spectroscopy}, keyword = {boron nitride, NEXAFS, XPS, point defects} }
@article{article, author = {Petravi\'{c}, Mladen and Peter, Robert and Fan, Liang-Jen and Yang, Yaw-Wen and Chen, Ying}, year = {2010}, pages = {94-97}, DOI = {10.1016/j.nima.2009.10.118}, keywords = {boron nitride, NEXAFS, XPS, point defects}, journal = {Nuclear Instruments and Methods in Physics Research. A}, doi = {10.1016/j.nima.2009.10.118}, volume = {619}, number = {1/3}, issn = {0168-9002}, title = {Direct observation of defects in hexagonal boron nitride by near- edge X-ray absorption fine structure and X-ray photoemission spectroscopy}, keyword = {boron nitride, NEXAFS, XPS, point defects} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus

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