Naslov
X-ray tracing study of crystal spectrometers for WDXRS application

Autori
Tadić, Tonči ; Jakšić, Milko ; Božičević, Iva

Izvornik
X-ray spectrometry (0049-8246) 38 (2009); 222-228

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
WDX ; crystal spectrometer ; X-ray tracing

Sažetak
Construction of a high energy resolution crystal X-ray spectrometer to be used for wavelength-dispersive X-ray emission spectroscopy (WDXRS) may result in different geometrical aberrations, such as systematic X-ray line shifts and changes of the X-ray line shape. Most of these aberrations can be reduced by careful design of a crystal spectrometer, keeping the efficiency of the spectrometer as high as possible. The availability of high-resolution position-sensitive detectors and small excitation beam sizes, and therefore a possible downsized Wavelength-dispersive X-ray (WDX) spectrometer, increase the need for reliable simulation of aberrations involved in WDXRS. Since the experimental investigation of the impact that WDX spectrometer design has on a particular aberration is rather time-consuming, a numerical X-ray tracing procedure, XTRACE, has been developed and applied for this purpose. Results are given in the form of virtual X-ray energy spectra that have been affected by the most important aberrations.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

POVEZANOST RADA