Pregled bibliografske jedinice broj: 425892
Practical Simulation of TEM-cell Coupling to PCB Tracks in the Circuit Simulator
Practical Simulation of TEM-cell Coupling to PCB Tracks in the Circuit Simulator // Proceedings EMC Compo 09 / Sickard, Etienne ; Ben Dhia, Sonia ; Vrignon, Bertrand (ur.).
Toulouse: INSA Toulouse, 2009. str. 1-4 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
CROSBI ID: 425892 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Practical Simulation of TEM-cell Coupling to PCB Tracks in the Circuit Simulator
Autori
Gillon, Renaud ; Vanhee, Filip ; Mandić, Tvrtko ; Barić, Adrijan ; Catrysse, Johan
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
Proceedings EMC Compo 09
/ Sickard, Etienne ; Ben Dhia, Sonia ; Vrignon, Bertrand - Toulouse : INSA Toulouse, 2009, 1-4
ISBN
036-0361621-1622
Skup
EMC Compo 2009 7th International Workshop on Electromagnetic Compatibility of Integrated Circuits
Mjesto i datum
Toulouse, Francuska, 17.11.2009. - 19.11.2009
Vrsta sudjelovanja
Poster
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
TEM cell; Coupling; Modelling; Microstrip; Coupling capacitance; Mutual inductance
Sažetak
The ability to predict the power injected in the pins of an IC during EM susceptibility tests is key to enable affordable and effective design of robust circuits. Radiated susceptibility tests are especially difficult to model in the circuit simulator as they involve distributed effects which do not map easily onto the nodal framework used in those simulators, where nets are inherently local. In the case of TEM fields however, usage of the transmission-line formalism is well established and allows to model the coupling effects using concepts of distributed RLCG parameters. This paper presents a simulation framework allowing to evaluate how much power is injected into PCB tracks subjected to TEM-cell fields. The proposed models were validated against 3D EM simulations as well as an extensive series of experiments, relying on the vector network analyzer for maximum accuracy. The simulation framework was implemented at ONSEMI in the CADENCE design environment. It uses one single PCB schematic to perform standard signal-integrity as well as TEM-cell field coupling simulations, and uses inherited connections to realize a ‘ wireless coupling’ between all PCB tracks and the TEM-cell septum.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika
POVEZANOST RADA
Projekti:
036-0361621-1622 - Kvaliteta signala u integriranim sklopovima s mješovitim signalom (Barić, Adrijan, MZO ) ( CroRIS)
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb
