Naslov
1.9 nm Wide Ultra-High Aspect-Ratio Bulk-Si FinFETs

Autori
Jovanović, Vladimir ; Poljak, Mirko ; Suligoj, Tomislav ; Civale, Yann ; Nanver, Lis K.

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Device Research Conference - Conference Digest / Koester, S. ; Gundlach, D. ; Fay, P. - : Institute of Electrical and Electronics Engineers (IEEE), 2009, 261-262

Skup
Device Research Conference

Mjesto i datum
State College (PA), Sjedinjene Američke Države, 22.06.2009. - 24.06.2009

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
bulk; body-tied; FinFET; ultra-high aspect-ratio

Sažetak
FinFETs are foreseen as a solution for the suppression of short-channel effects (SCE) from the 22 nm node onwards because of their superior electrostatic integrity achieved with a fabrication technique that is similar to bulk CMOS processes. To keep SCEs under control the width of the etched fins must be reduced as the gate-length is scaled down. The fin-height is typically reduced as well to keep the same aspect ratio between the fin-height and fin-width which allows the same fin-etching processes to be used also for smaller devices. This work focuses on FinFETs with high aspect-ratio and thus a wide MOSFET channels in each fin, which translates into higher device density per chip area and more efficient use of the silicon real-estate. Moreover, in analog applications where multi-fin devices are required for wider transistors, a small number of taller fins is preferable to a large number of shorter fins in terms of gate resistance and gate capacitance which improves high-frequency performance. The fabrication process is designed to keep the fin-width in the 10 nm range while at the same time tall fins are etched.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika

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