Pregled bibliografske jedinice broj: 39944
EPR study of a-Si structural relaxation
EPR study of a-Si structural relaxation // Nuclear instruments and methods in physics research - section B : beam interactions with materials and atoms, 147 (1999), 1-4; 132-135 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 39944 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
EPR study of a-Si structural relaxation
Autori
Pivac, Branko ; Rakvin, Boris ; Reitano, R.
Izvornik
Nuclear instruments and methods in physics research - section B : beam interactions with materials and atoms (0168-583X) 147
(1999), 1-4;
132-135
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
amorphous silicon; ion beam amorphisation; structural relaxation; electron paramagnetic resonance
Sažetak
A detailed analysis of the EPR line-shape was performed on amorphous silicon (a-Si) saamples obtained by Kr+ ion implantation. It is shown that the line has predominantly Lorentzian character, however, a small Gaussian component is present as well. We monitored line-shape bahavior during the relaxation and subsequent derelaxation process. A strong fourfold increase in Gaussian component has been observed upon structural relaxation, suggesting spin homogenization throughout the bulk. Subsequent ion implantation derelaxation caused gradual return of the Lorentzian character, i.e. cluster structure of the amorphous phase.
Izvorni jezik
Engleski
Znanstvena područja
Kemija
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
