Pregled bibliografske jedinice broj: 373004
Measurement of the refractive index and thickness of a transparent film from the shift of the interference pattern due to the sample rotation
Measurement of the refractive index and thickness of a transparent film from the shift of the interference pattern due to the sample rotation // Thin solid films, 518 (2010), 14; 3619-3624 doi:10.1016/j.tsf.2009.09.067 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 373004 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Measurement of the refractive index and thickness of a transparent film from the shift of the interference pattern due to the sample rotation
Autori
Šantić, Branko
Izvornik
Thin solid films (0040-6090) 518
(2010), 14;
3619-3624
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
thin films ; semiconductors ; optical transmission
Sažetak
A method is described for the simultaneous measurement of the refractive index and thickness of a transparent film. The method is based on the rotational shift of the interference pattern caused by the change of the light incidence angle. The refractive index is evaluated without any prior information about film thickness or about the substrate and its refractive index. In addition, the roughness of the interfaces and/or the presence of an unidentified thin layer are not important. In two experimental examples, the refractive index and thickness are measured for a GaN thin film and a cling-film.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
098-0982886-2897 - Poluvodički materijali za optoelektroniku i nanotehnologiju (Šantić, Branko, MZOS ) ( CroRIS)
Ustanove:
Institut "Ruđer Bošković", Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
