Pregled bibliografske jedinice broj: 37240
Small angle scattering of synchrotron radiation on nanosized CeO2 and CeO2-SnO2 thin films obtained by sol-gel dip-coating method
Small angle scattering of synchrotron radiation on nanosized CeO2 and CeO2-SnO2 thin films obtained by sol-gel dip-coating method // Nanostructured materials, 11 (1999), 7; 909-915 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 37240 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Small angle scattering of synchrotron radiation on nanosized CeO2 and CeO2-SnO2 thin films obtained by sol-gel dip-coating method
Autori
Turković, Aleksandra ; Dubček, Pavo ; Crnjak-Orel, Zorica ; Bernstorff, S.
Izvornik
Nanostructured materials (0965-9773) 11
(1999), 7;
909-915
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
SAXS; sol-gel; CeO2; CeO2-SnO2
Sažetak
Nanosized CeO2, and CeO2-SnO2, 100 -500 nm thick, films on glass substrate were prepared using sol-gel dip-coating method procedure. The average grain size <R>, obtained by SAXS( small-angle X-ray scattering), varied with the number of dips for the CeO2-SnO2 samples. For the CeO2 films, obtained by dipping it 8 times, <R> increased compared to CeO2-SnO2 films, which were obtained by the same number of dips, from 4, 4 to 5, 3 nm. Specific surface areas of both these films were also determined and varied from 0.18x107 to 0.51x107 cm-1. SAXS measurements also revealed the layered structure of CeO2 and CeO2-SnO2 films.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
Uključenost u ostale bibliografske baze podataka::
- The INSPEC Science Abstracts series
