Pregled bibliografske jedinice broj: 371790
Technique for sensitive carbon depth profiling in thin samples using C-C elastic scattering
Technique for sensitive carbon depth profiling in thin samples using C-C elastic scattering // Journal of analytical atomic spectrometry, 24 (2009), 2; 194-198 doi:10.1039/B810316J (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 371790 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Technique for sensitive carbon depth profiling in thin samples using C-C elastic scattering
Autori
Bogdanović-Radović, Ivančica ; Jakšić, Milko ; Schiettekatte, Francois
Izvornik
Journal of analytical atomic spectrometry (0267-9477) 24
(2009), 2;
194-198
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
elastic scattering ; carbon-carbon scattering
Sažetak
A technique for carbon depth profiling in thin samples is described. It is developed to analyze low concentrations of carbon in heavier matrices. The method is based on the carbon-carbon elastic scattering coincidence measurement. Recoiled carbon atoms as well as scattered carbon ions from the primary beam are detected by two solid state detectors placed symmetrically at 45° around the beam direction. Since scattering products are detected in forward direction, method can be applied only for transmission samples with thicknesses of the order of several micrometers. Capabilities of the technique concerning depth resolution and sensitivity were tested on samples with known composition and depth distribution of carbon.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
098-1191005-2876 - Procesi interakcije ionskih snopova i nanostrukture (Jakšić, Milko, MZOS ) ( CroRIS)
Ustanove:
Institut "Ruđer Bošković", Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
