Pregled bibliografske jedinice broj: 36611
WDX-PIXE analysis of low energy X-rays using a microbeam
WDX-PIXE analysis of low energy X-rays using a microbeam // Nuclear instruments & methods in physics research. Section B. Beam interactions with materials and atoms, 150 (1999), 1-4; 109-113 doi:10.1016/S0168-583X(98)00921-5 (međunarodna recenzija, članak, znanstveni)
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Naslov
WDX-PIXE analysis of low energy X-rays using a microbeam
Autori
Mokuno, Y. ; Horino, Y. ; Tadić, Tonči ; Terasawa, M. ; Kinomura, A. ; Chayahara, A. ; Tsubouchi, N.
Izvornik
Nuclear instruments & methods in physics research. Section B. Beam interactions with materials and atoms (0168-583X) 150
(1999), 1-4;
109-113
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
resolution pixe; spectra
Sažetak
A high-energy resolution PIXE system developed at a heavy ion microbeam line was used to analyze low energy X-rays below 1 KeV. The system is equipped with a plane crystal spectrometer with a gas flow position sensitive proportional counter (PSPC), which enables high-energy resolution PIXE analysis using a microbeam. In order to improve the detection efficiency for the low energy X-rays, the X-ray entrance window of the PSPC was replaced with a thin polymer film supported by a metal grid. As the result, the detectable energy range was extended to carbon K X-rays and chemical effect in Fe and Cu L X-rays could be detected. A preliminary result of high energy resolution PIXE mapping of Cu mesh showed that it is possible to obtain the Cu Lalpha mapping image using a 2 MeV proton microbeam with the size of 20x20 micro m.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
