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Pregled bibliografske jedinice broj: 358849

First sub-30nm vertical Silicon-On-Nothing MOSFET


Hoellt, Lothar; Schulze, Joerg; Eisele, Ignaz; Suligoj, Tomislav; Jovanović, Vladimir; Thompson, Phill E.
First sub-30nm vertical Silicon-On-Nothing MOSFET // Proceedings of the 31st International Convention MIPRO / Biljanović, P. ; Skala, K. (ur.).
Zagreb: Denona, 2008. str. 90-95 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)


CROSBI ID: 358849 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
First sub-30nm vertical Silicon-On-Nothing MOSFET

Autori
Hoellt, Lothar ; Schulze, Joerg ; Eisele, Ignaz ; Suligoj, Tomislav ; Jovanović, Vladimir ; Thompson, Phill E.

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Proceedings of the 31st International Convention MIPRO / Biljanović, P. ; Skala, K. - Zagreb : Denona, 2008, 90-95

ISBN
978-953-233-036-6

Skup
31st International Convention MIPRO

Mjesto i datum
Opatija, Hrvatska, 26.05.2008. - 30.05.2008

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
silicon-on-nothing (SON); vertical SONFET; SiGe; sub-30 nm; etching selectivity

Sažetak
The first vertical fully-depleted “ silicon-onnothing” field-effect transistor (SONFET) device with a channel length less than 30nm is introduced. The key idea is the determination of transistor channel length as well as depletion width by means of well defined epitaxial growth. To obtain the transistor channel a sacrificial layer made from silicon germanium (Si1-xGex) and the selective wet-chemical removal of this layer is used. In a first step this sacrificial layer, grown under biaxial compression by means of CVD, is used for physical channel length definition and to introduce uniaxial strain to intrinsic silicon channel grown afterwards by means of CVD. The thickness of this intrinsic layer defines the channel depletion width. In a final step the sacrificial Si1-xGex is selectively removed and the uniaxial strained silicon channel, connecting source and drain remains free standing.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika



POVEZANOST RADA


Projekti:
036-0361566-1567 - Nanometarski elektronički elementi i sklopovske primjene (Suligoj, Tomislav, MZO ) ( CroRIS)
036-0982904-1642 - Sofisticirane poluvodičke strukture za komunikacijsku tehnologiju (Koričić, Marko, MZO ) ( CroRIS)

Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb

Profili:

Avatar Url Vladimir Jovanović (autor)

Avatar Url Tomislav Suligoj (autor)


Citiraj ovu publikaciju:

Hoellt, Lothar; Schulze, Joerg; Eisele, Ignaz; Suligoj, Tomislav; Jovanović, Vladimir; Thompson, Phill E.
First sub-30nm vertical Silicon-On-Nothing MOSFET // Proceedings of the 31st International Convention MIPRO / Biljanović, P. ; Skala, K. (ur.).
Zagreb: Denona, 2008. str. 90-95 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
Hoellt, L., Schulze, J., Eisele, I., Suligoj, T., Jovanović, V. & Thompson, P. (2008) First sub-30nm vertical Silicon-On-Nothing MOSFET. U: Biljanović, P. & Skala, K. (ur.)Proceedings of the 31st International Convention MIPRO.
@article{article, author = {Hoellt, Lothar and Schulze, Joerg and Eisele, Ignaz and Suligoj, Tomislav and Jovanovi\'{c}, Vladimir and Thompson, Phill E.}, year = {2008}, pages = {90-95}, keywords = {silicon-on-nothing (SON), vertical SONFET, SiGe, sub-30 nm, etching selectivity}, isbn = {978-953-233-036-6}, title = {First sub-30nm vertical Silicon-On-Nothing MOSFET}, keyword = {silicon-on-nothing (SON), vertical SONFET, SiGe, sub-30 nm, etching selectivity}, publisher = {Denona}, publisherplace = {Opatija, Hrvatska} }
@article{article, author = {Hoellt, Lothar and Schulze, Joerg and Eisele, Ignaz and Suligoj, Tomislav and Jovanovi\'{c}, Vladimir and Thompson, Phill E.}, year = {2008}, pages = {90-95}, keywords = {silicon-on-nothing (SON), vertical SONFET, SiGe, sub-30 nm, etching selectivity}, isbn = {978-953-233-036-6}, title = {First sub-30nm vertical Silicon-On-Nothing MOSFET}, keyword = {silicon-on-nothing (SON), vertical SONFET, SiGe, sub-30 nm, etching selectivity}, publisher = {Denona}, publisherplace = {Opatija, Hrvatska} }




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