Pregled bibliografske jedinice broj: 358669
Upper critical field, penetration depth, and depinning frequency of the high-temperature superconductor LaFeAsO_0.9F_0.1 studied by microwave surface impedance
Upper critical field, penetration depth, and depinning frequency of the high-temperature superconductor LaFeAsO_0.9F_0.1 studied by microwave surface impedance // Physical Review B - Condensed Matter and Materials Physics, 78 (2008), 1; 012507-1 doi:10.1103/PhysRevB.78.012507 (međunarodna recenzija, članak, znanstveni)
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Naslov
Upper critical field, penetration depth, and depinning frequency of the high-temperature superconductor LaFeAsO_0.9F_0.1 studied by microwave surface impedance
Autori
Narduzzo, A. ; Grbić, Mihael Srđan ; Požek, Miroslav ; Dulčić, Antonije ; Paar, Dalibor ; Kondrat, A. ; Hess, C. ; Hellmann, I. ; Klingeler, R. ; Werner, J. ; Köhler, A. ; Behr, G. ; Büchner, B.
Izvornik
Physical Review B - Condensed Matter and Materials Physics (1098-0121) 78
(2008), 1;
012507-1
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
microwave response; upper critical fields; penetration depth
Sažetak
Temperature and magnetic field dependent measurements of the microwave surface impedance in the novel superconductor LaO_0.9F_0.1FeAs reveal a very large upper critical field (\Bc2~$\approx 56$T) and a large value of the depinning frequency (f_0 \approx 6GHz) together with the measured effective penetration depth, \lambda_eff=200 \pm 50$nm, our results indicate a stark similarity between this system and the high-T_c superconducting cuprates.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
119-1191458-1022 - Mikrovalna istraživanja novih materijala (Požek, Miroslav, MZOS ) ( CroRIS)
Ustanove:
Prirodoslovno-matematički fakultet, Zagreb
Profili:
Antonije Dulčić
(autor)
Miroslav Požek
(autor)
Dalibor Paar
(autor)
Mihael Srđan Grbić
(autor)
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus