Pregled bibliografske jedinice broj: 358500
Growth and Electronic properties of ultra-thin Ag films
Growth and Electronic properties of ultra-thin Ag films // Surface Science, 603 (2009), 1; 125-130 doi:10.1016/j.susc.2008.10.044 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 358500 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Growth and Electronic properties of ultra-thin Ag films
Autori
Mikšić Trontl, Vesna ; Pervan, Petar ; Milun, Milorad
Izvornik
Surface Science (0039-6028) 603
(2009), 1;
125-130
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
ultra thin films; epitaxy; silver; nickel; angle resolved photoemission; scanning tunneling microscopy; quantum wells
Sažetak
We present experimental study of the growth mode and electronic properties of ultra-thin silver films deposited on Ni(111) surface by means of scanning tunnelling microscopy (STM) and high resolution angle resolved photoemission spectroscopy (HR-ARPES). The formation of the 4d-quantum well states (QWS) was found in agreement with the Stranski-Krastanow growth mode of Ag(111). The electronic structure of the 1 ML film is consistent with the silver layer which very weakly interacts with the supporting surface. The analysis of the lineshape of Ag-4d QW states suggests strong localization of the electronic states within the silver layer but at the same time the decay of the photo-hole appears to be influenced by the dynamics of the electrons in the supporting surface.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
035-0352828-2840 - Elektronska i kristalna struktura poduprtih samoorganiziranih nano-sistema (Pervan, Petar, MZOS ) ( CroRIS)
Ustanove:
Institut za fiziku, Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
