Pregled bibliografske jedinice broj: 357665
Nanoporous TiO2 capping layer for transparent conductive electrodes
Nanoporous TiO2 capping layer for transparent conductive electrodes // New frontiers of low-cost photovoltaic solar cells 2008 - Abstract Book
Skopje, 2008. str. 40-40 (predavanje, nije recenziran, sažetak, znanstveni)
CROSBI ID: 357665 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Nanoporous TiO2 capping layer for transparent conductive electrodes
Autori
Ristova, Mimoza M ; Nasov, Ilija ; Gracin, Davor ; Milun, Milan ; Juraić, Krunoslav ; Kostadinova, Hristina ; Smilkov, Svetislav
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
New frontiers of low-cost photovoltaic solar cells 2008 - Abstract Book
/ - Skopje, 2008, 40-40
ISBN
978-9989-2870-0-8
Skup
New frontiers of low-cost photovoltaic solar cells 2008 - Workshop
Mjesto i datum
Skopje, Sjeverna Makedonija, 29.05.2008. - 31.05.2008
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Nije recenziran
Ključne riječi
Titanium dioxide; capping layer; TCO; hydrogen plasma
Sažetak
Titanium dioxide thin films were deposited by PVD arc evaporation from Ti target in an oxygen atmospher onto (a) fluorine doped tin oxide substrate (FTO) and (b) microscopic glass slides. The growth rate was calculated from the film thickness profilometry measurements versus the deposition time. The X-ray photoemission spectroscopy analysis the Ti2p binding energy electron shift, suggested TiO2 stoichiometric compound. The films were highly transparent for the visible light with a transmittance of about 85% for the film of 1 micron thickness. The results for the RMS surface roughness of the films deposited onto FTO substrate (RMS ~ 9 nm) evaluated from the atomic force microscopy (AFM) analysis suggested on nanoporous structures. Regardless of the low conductivity the TiO2 films, their nanoporosity allowed application of a nano TiOx layer as a top capping layer onto FTO films. The sheet resistance of the nano TiO2/FTO double layer was studied as a function of the TiO2 thickness. The layers were exposed to hydrogen plasma and the change in the transmittance and the sheet resistance were discussed.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
098-0982886-2894 - Tanki filmovi legura silicija na prijelazu iz amorfne u uređenu strukturu (Gracin, Davor, MZOS ) ( CroRIS)
Ustanove:
Institut "Ruđer Bošković", Zagreb