Pregled bibliografske jedinice broj: 341154
Spectrometric and ellipsometric studies of (1-x)TiO2×xLn2O3 (Ln= Nd, Sm, Gd, Er, Yb) thin films
Spectrometric and ellipsometric studies of (1-x)TiO2×xLn2O3 (Ln= Nd, Sm, Gd, Er, Yb) thin films // Journal of non-crystalline solids, 353 (2007), 1; 31-35 (međunarodna recenzija, članak, znanstveni)
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Naslov
Spectrometric and ellipsometric studies of (1-x)TiO2×xLn2O3 (Ln= Nd, Sm, Gd, Er, Yb) thin films
Autori
Kranjčec, Mladen ; Studenyak, I.P. ; Nahusko, O.T.
Izvornik
Journal of non-crystalline solids (0022-3093) 353
(2007), 1;
31-35
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
films and coatings; ellipsometry; optical spectroscopy
Sažetak
Spectrometric and ellipsometric studies of (1 − x)TiO2 ? xLn2O3 (Ln = Nd, Sm, Gd, Er, Yb ; x = 0.33, 0.5) thin films at room temperature were performed. The obtained dispersion dependences of refractive indices are successfully described by the optical-refractometric relation. The dependence of optical pseudogap and refractive indices on composition and molar mass of the films is investigated. The influence of compositional disordering on the energy width of the exponential absorption edge is studied.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
160-0982886-0873 - Nano-efekti i utjecaji neuređenosti u materijalima za ioniku čvrstog stanja (Kranjčec, Mladen, MZOS ) ( CroRIS)
Ustanove:
Geotehnički fakultet, Varaždin
Profili:
Mladen Kranjčec
(autor)
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
