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Pregled bibliografske jedinice broj: 341150

Compositional dependence of optical parameters of Ti1-xZrxO2 thin films


Studenyak, I.P.; Nahusko, O.T.; Kranjčec, Mladen
Compositional dependence of optical parameters of Ti1-xZrxO2 thin films // Journal of optoelectronics and advanced materials, 8 (2006), 4; 1484-1487 (međunarodna recenzija, članak, znanstveni)


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Naslov
Compositional dependence of optical parameters of Ti1-xZrxO2 thin films

Autori
Studenyak, I.P. ; Nahusko, O.T. ; Kranjčec, Mladen

Izvornik
Journal of optoelectronics and advanced materials (1454-4164) 8 (2006), 4; 1484-1487

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
amorphous materials; optical coatings; ellipsometry; optical spectroscopy

Sažetak
Ellipsometric and spectroscopic investigations of Ti1-xZrxO2 thin films were performed. Dispersion dependences of refractive indices and extinction coefficients in the wavelength interval 0.2?0.7 μ m were obtained by optical-refractometric synthesis of transmission spectra ; optical-refractometric relation was applied to describe the dispersion of the refractive indices. A nonlinear increase of optical pseudogap and a nonlinear decrease of refractive indices with substitution of Ti by Zr was revealed.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Ustanove:
Geotehnički fakultet, Varaždin

Profili:

Avatar Url Mladen Kranjčec (autor)


Citiraj ovu publikaciju:

Studenyak, I.P.; Nahusko, O.T.; Kranjčec, Mladen
Compositional dependence of optical parameters of Ti1-xZrxO2 thin films // Journal of optoelectronics and advanced materials, 8 (2006), 4; 1484-1487 (međunarodna recenzija, članak, znanstveni)
Studenyak, I., Nahusko, O. & Kranjčec, M. (2006) Compositional dependence of optical parameters of Ti1-xZrxO2 thin films. Journal of optoelectronics and advanced materials, 8 (4), 1484-1487.
@article{article, author = {Studenyak, I.P. and Nahusko, O.T. and Kranj\v{c}ec, Mladen}, year = {2006}, pages = {1484-1487}, keywords = {amorphous materials, optical coatings, ellipsometry, optical spectroscopy}, journal = {Journal of optoelectronics and advanced materials}, volume = {8}, number = {4}, issn = {1454-4164}, title = {Compositional dependence of optical parameters of Ti1-xZrxO2 thin films}, keyword = {amorphous materials, optical coatings, ellipsometry, optical spectroscopy} }
@article{article, author = {Studenyak, I.P. and Nahusko, O.T. and Kranj\v{c}ec, Mladen}, year = {2006}, pages = {1484-1487}, keywords = {amorphous materials, optical coatings, ellipsometry, optical spectroscopy}, journal = {Journal of optoelectronics and advanced materials}, volume = {8}, number = {4}, issn = {1454-4164}, title = {Compositional dependence of optical parameters of Ti1-xZrxO2 thin films}, keyword = {amorphous materials, optical coatings, ellipsometry, optical spectroscopy} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus





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