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Pregled bibliografske jedinice broj: 341103

Influence of Hf->Zr substitution on optical and refractometric parameters of Hf1-xZrxO2 thin films

Studenyak, I.P.; Kranjčec, Mladen; Nahusko, O.T.; Borets, O.M.
Influence of Hf->Zr substitution on optical and refractometric parameters of Hf1-xZrxO2 thin films // Thin Solid Films, 476 (2005), 1; 137-141 doi:10.1016/j.tsf.2004.09.048 (međunarodna recenzija, članak, znanstveni)

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Naslov
Influence of Hf->Zr substitution on optical and refractometric parameters of Hf1-xZrxO2 thin films

Autori
Studenyak, I.P. ; Kranjčec, Mladen ; Nahusko, O.T. ; Borets, O.M.

Izvornik
Thin Solid Films (0040-6090) 476 (2005), 1; 137-141

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
amorphous materials; optical coatings; ellipsometry; optical spectroscopy

Sažetak
Ellipsometric and spectroscopic investigations of Hf1− xZrxO2 thin films were performed. Dispersion dependences of refractive indices and extinction coefficients in the wavelength interval 0.2?0.7 μ m were obtained by optical-refractometric synthesis of absorption spectra. Optical-refractometric relation is applied to describe the dispersion of the refractive indices. Compositional behaviour of optical pseudogap and refractive indices of HfO2?ZrO2 thin films is studied.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA

Projekti:
0160004

Ustanove:
Geotehnički fakultet, Varaždin

Profili:

Avatar Url Mladen Kranjčec (autor)

Poveznice na cjeloviti tekst rada:

doi www.sciencedirect.com

Citiraj ovu publikaciju:

Studenyak, I.P.; Kranjčec, Mladen; Nahusko, O.T.; Borets, O.M.
Influence of Hf->Zr substitution on optical and refractometric parameters of Hf1-xZrxO2 thin films // Thin Solid Films, 476 (2005), 1; 137-141 doi:10.1016/j.tsf.2004.09.048 (međunarodna recenzija, članak, znanstveni)
Studenyak, I., Kranjčec, M., Nahusko, O. & Borets, O. (2005) Influence of Hf->Zr substitution on optical and refractometric parameters of Hf1-xZrxO2 thin films. Thin Solid Films, 476 (1), 137-141 doi:10.1016/j.tsf.2004.09.048.
@article{article, author = {Studenyak, I.P. and Kranj\v{c}ec, Mladen and Nahusko, O.T. and Borets, O.M.}, year = {2005}, pages = {137-141}, DOI = {10.1016/j.tsf.2004.09.048}, keywords = {amorphous materials, optical coatings, ellipsometry, optical spectroscopy}, journal = {Thin Solid Films}, doi = {10.1016/j.tsf.2004.09.048}, volume = {476}, number = {1}, issn = {0040-6090}, title = {Influence of Hf->Zr substitution on optical and refractometric parameters of Hf1-xZrxO2 thin films}, keyword = {amorphous materials, optical coatings, ellipsometry, optical spectroscopy} }
@article{article, author = {Studenyak, I.P. and Kranj\v{c}ec, Mladen and Nahusko, O.T. and Borets, O.M.}, year = {2005}, pages = {137-141}, DOI = {10.1016/j.tsf.2004.09.048}, keywords = {amorphous materials, optical coatings, ellipsometry, optical spectroscopy}, journal = {Thin Solid Films}, doi = {10.1016/j.tsf.2004.09.048}, volume = {476}, number = {1}, issn = {0040-6090}, title = {Influence of Hf->Zr substitution on optical and refractometric parameters of Hf1-xZrxO2 thin films}, keyword = {amorphous materials, optical coatings, ellipsometry, optical spectroscopy} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus

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