Pregled bibliografske jedinice broj: 3380
Electrons and Holes Lifetimes as Function of Deep Energy Level Position
Electrons and Holes Lifetimes as Function of Deep Energy Level Position // Proceedings of ELMAR '97 / Radanović, Božidar ; Vistrička, Jaroslav (ur.).
Zadar: Hrvatsko društvo Elektronika u pomorstvu (ELMAR), 1997. str. 344-348 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
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Naslov
Electrons and Holes Lifetimes as Function of Deep Energy Level Position
Autori
Divković-Pukšec, Julijana
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
Proceedings of ELMAR '97
/ Radanović, Božidar ; Vistrička, Jaroslav - Zadar : Hrvatsko društvo Elektronika u pomorstvu (ELMAR), 1997, 344-348
Skup
Electronics in Marine ELMAR '97, 39th International Symposium
Mjesto i datum
Zadar, Hrvatska, 25.06.1997. - 27.06.1997
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
lifetime; recombination; deep energy level
Sažetak
The most important parameters of semiconductor devices depend on electrons" and holes" lifetimes. Recombinations centers are introduced into semiconductors with the purpose to influence the lifetimes. These centers introduced energy levels into semiconductor's band gap. Usually, one of them is dominant. The influence of the position of such deep energy level and the Fermi level on the lifetime is considered and presented in this work. Measurement is made on an p"pnn" structure into which various deep trap were added its' deep energy lays over or under the Fermi level. Measured and calculated holes" lifetime as a function of the injection level is presented.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika
POVEZANOST RADA
Projekti:
036001
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb
Profili:
Julijana Divković-Pukšec
(autor)