Pregled bibliografske jedinice broj: 33531
Quantum mechanical analysis of the elastic propagation of electrons in the Au/Si system : application to ballistic electron emission microscopy
Quantum mechanical analysis of the elastic propagation of electrons in the Au/Si system : application to ballistic electron emission microscopy // Physical review. B, Condensed matter and materials physics, 58 (1998), 20; 14036-14042 doi:10.1103/PhysRevB.58.14036 (međunarodna recenzija, članak, znanstveni)
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Naslov
Quantum mechanical analysis of the elastic propagation of electrons in the Au/Si system : application to ballistic electron emission microscopy
Autori
Reuter, Karsten ; Andres, Pedro ; Garcia-Vidal, Francisko ; Šestović, Dragan ; Flores, Fernando ; Heinz, Konrad
Izvornik
Physical review. B, Condensed matter and materials physics (1098-0121) 58
(1998), 20;
14036-14042
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
BEEM ; LCAO ; electron transport
Sažetak
We present a Green's function approach based on a LCAO scheme to compute the elastic propagation of electrons injected from a STM tip into a metallic film. The obtained 2D current distribution in real and reciprocal space furnish a good representation of the elastic component of Ballistic Electron Emission Microscopy (BEEM) currents. Since this component accurately approximates the total current in the near threshold region, this procedure allows --in contrast to prior analyses-- to take into account effects of the metal band structure in the modeling of these experiments. The Au band structure, and in particular its gaps appearing in the [111] and [100] directions provides a good explanation for the previously irreconcilable results of nanometric resolution and similarity of BEEM spectra on both Au/Si(111) and Au/Si(100).
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus