Pregled bibliografske jedinice broj: 328786
Finite element modelling of the electrical impulse induced fracture of a high voltage varistor
Finite element modelling of the electrical impulse induced fracture of a high voltage varistor // Journal of the European Ceramic Society, 20 (2000), 8; 1017-1021 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 328786 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Finite element modelling of the electrical impulse induced fracture of a high voltage varistor
Autori
Lengauer, Markus ; Rubeša, Domagoj ; Danzer, Robert
Izvornik
Journal of the European Ceramic Society (0955-2219) 20
(2000), 8;
1017-1021
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
failure analysis; finite element method; fracture; varistor; electrical pulse
Sažetak
In testing and in service, varistors are subjected to very short (microsecond range) high current pulses. Due to the inertia effects that appear on rapid Joule heating dynamics stress waves are generated, which can cause brittle failure. An analytical solution for the one-dimensional case was presented recently by Vojta and Clarke. In this work a full three-dimensional analysis of an axisymmetrical varistor has been performed using Finite Element Simulation. The reflections of the stress waves from the bases and the shell of a varistor and their interference are analysed. The resulting stress field and its development with time is much more complex than in the 1D case. The aspect ratio of the varistor has been shown to have a strong influence on the amplitude of the mechanical stresses and can be varied to minimize the maximum stress level reached. Damping has been considered but found to be negligible in realistic cases.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika, Temeljne tehničke znanosti
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus