Pregled bibliografske jedinice broj: 327479
Design and Use of FR-4 CBCPW Lines In Test Fixtures for SMD Components
Design and Use of FR-4 CBCPW Lines In Test Fixtures for SMD Components // Proceedings of the 14th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2007 / Eleuldj, M. ; Zwolinski, M. (ur.).
Marakeš: Institute of Electrical and Electronics Engineers (IEEE), 2007. str. 375-378 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
CROSBI ID: 327479 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Design and Use of FR-4 CBCPW Lines In Test Fixtures for SMD Components
Autori
Pejčinović, Branimir ; Čeperić, Vladimir ; Barić, Adrijan
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
Proceedings of the 14th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2007
/ Eleuldj, M. ; Zwolinski, M. - Marakeš : Institute of Electrical and Electronics Engineers (IEEE), 2007, 375-378
ISBN
1-4244-1378-8
Skup
14th IEEE International Conference on Electronics, Circuits and Systems
Mjesto i datum
Marakeš, Maroko, 11.12.2007. - 14.12.2007
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
microstrip lines; co-planar waveguide lines; SMD components
Sažetak
High frequency/speed designs still predominantly use microstrip lines on relatively cheap FR-4 substrates, despite their relatively poor high frequency performance. One good alternative is to use CBCPW lines (conductor backed co-planar waveguide). Compared to CBCPW, microstrip lines are more susceptible to interference (EMI) and can more easily generate interference themselves. We have designed a number of lines that are used as “ fixtures” to access SMD components and report on their performance. Designs are improved through extensive electromagnetic simulations and potential pitfalls are identified. For the lower GHz range, up to 3 GHz, we also report on the modeling of passive SMD components - capacitors and resistors - where good agreement between measurement and simulation is observed. Finally, we report on use of TDR technique for measurement and modeling and how it compares with VNA-based measurements.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika
POVEZANOST RADA
Projekti:
036-0361621-1622 - Kvaliteta signala u integriranim sklopovima s mješovitim signalom (Barić, Adrijan, MZO ) ( CroRIS)
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb