Pregled bibliografske jedinice broj: 322658
Analysis of conducted electromagnetic emissions in integrated circuits
Analysis of conducted electromagnetic emissions in integrated circuits, 2007., magistarski rad, Fakultet elektrotehnike i računarstva, Zagreb
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Naslov
Analysis of conducted electromagnetic emissions in integrated circuits
Autori
Čeperić, Vladimir
Vrsta, podvrsta i kategorija rada
Ocjenski radovi, magistarski rad
Fakultet
Fakultet elektrotehnike i računarstva
Mjesto
Zagreb
Datum
04.10
Godina
2007
Stranica
113
Mentor
Barić, Adrijan
Ključne riječi
design; integrated circuits; electromagnetic compatibility; electromagnetic emissions; electromagnetic immunity
Sažetak
Design of integrated circuits (IC) is a very complex task. One of the most critical steps in the design process is the estimation of electromagnetic compatibility (EMC) of the designed circuit. Electronic equipment has to comply with electromagnetic compatibility standards and integrated circuits are most often the root cause of disturbances in electronic systems. The standards regarding conducted EME (Electromagnetic Emission) and EMI (Electromagnetic Immunity) are measured and simulated as the first step towards achieving EM compatibility. Models suitable for simulations of EM emissions and immunity are developed and their accuracy is assessed. An EMC aware design procedure and effective circuit optimization strategy are demonstrated. An EMC test chip is designed in submicron CMOS technology, processed, measured and the measurement results are compared with simulations in order to demonstrate the validity and accuracy of models and procedures described in this thesis.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika
POVEZANOST RADA
Projekti:
036-0361621-1622 - Kvaliteta signala u integriranim sklopovima s mješovitim signalom (Barić, Adrijan, MZO ) ( CroRIS)
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb