Pregled bibliografske jedinice broj: 319016
TSCAP and Admittance Spectroscopy of Defects Induced by Gamma-Rays in GaP
TSCAP and Admittance Spectroscopy of Defects Induced by Gamma-Rays in GaP // Institute of physics conference series, 25 (1973), 341-346 (podatak o recenziji nije dostupan, članak, znanstveni)
CROSBI ID: 319016 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
TSCAP and Admittance Spectroscopy of Defects Induced by Gamma-Rays in GaP
Autori
Desnica, Uroš ; Etlinger, Božidar ; Urli, Natko
Izvornik
Institute of physics conference series (0951-3248) 25
(1973);
341-346
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
TSCAP; admitance spectroscopy; defects; GaP
Sažetak
Radiation damage has been introduced into GaP diodes by Co gamma irradiation at 300 K.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove:
Institut "Ruđer Bošković", Zagreb