Pregled bibliografske jedinice broj: 316961
Effective film thickness influence on self-organization of ge islands on si(100) substrates
Effective film thickness influence on self-organization of ge islands on si(100) substrates // ABSTRACT CD, IVC17/ICSS13 & ICN+T2007 / Westerberg, Lars ; Karlsson, Ulf (ur.).
Stockholm: Organizing CommitteeABSTRACT CD, 2007. str. TFSEP2-288 (poster, međunarodna recenzija, sažetak, znanstveni)
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Naslov
Effective film thickness influence on self-organization of ge islands on si(100) substrates
Autori
Dubček, Pavo ; Pivac, Branko ; Capan, Ivana ; Radić, Nikola ; Bernstorff, Sigrid
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
ABSTRACT CD, IVC17/ICSS13 & ICN+T2007
/ Westerberg, Lars ; Karlsson, Ulf - Stockholm : Organizing CommitteeABSTRACT CD, 2007, TFSEP2-288
Skup
IVC17/ICSS13 & ICN+T2007
Mjesto i datum
Stockholm, Švedska, 02.07.2007. - 06.07.2007
Vrsta sudjelovanja
Poster
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
Ge islands; self-organization
Sažetak
Germanium islands were produced by magnetron sputtering of Ge onto monocrystalline silicon, where effective Ge thickness was varied from 2 to 6 nm. The shape and distribution of the islands were investigated using grazing incidence small-angle X-ray scattering (GISAXS) and atomic force microscopy (AFM). The GISAXS experiments revealed that Ge islands height varied from 3 to 6 nm and the lateral dimensions of 10 to 20 nm. However, AFM results indicated bigger sizes, and this is attributed to different resolution ranges of the two experimental techniques. Tuning the deposition conditions and subsequent treatments may allow the control of the size and shape of the islands and consequently the energy levels that drive the light absorption spectra. Such simple process could be of great interest for the third generation of solar cells, aiming to very high efficiencies at low cost.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
098-0982886-2866 - Temeljna svojstva nanostruktura i defekata u poluvodičima i dielektricima (Pivac, Branko, MZOS ) ( CroRIS)
098-0982886-2895 - Novi amorfni i nanostrukturirani tankoslojni materijali (Radić, Nikola, MZOS ) ( CroRIS)
Ustanove:
Institut "Ruđer Bošković", Zagreb