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Pregled bibliografske jedinice broj: 315329

On the evaluation of optical parameters of a thin semiconductor film from transmission spectra, and application to GaN films


Šantić, Branko; Scholz, Ferdinand
On the evaluation of optical parameters of a thin semiconductor film from transmission spectra, and application to GaN films // Measurement science & technology, 19 (2008), 10; 105303, 7 doi:10.1088/0957-0233/19/10/105303 (međunarodna recenzija, članak, znanstveni)


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Naslov
On the evaluation of optical parameters of a thin semiconductor film from transmission spectra, and application to GaN films

Autori
Šantić, Branko ; Scholz, Ferdinand

Izvornik
Measurement science & technology (0957-0233) 19 (2008), 10; 105303, 7

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
thin films ; semiconductors ; optical transmission

Sažetak
The analysis of the optical transmission spectra of semiconductor thin films on a transparent substrate is revisited. The equation for the optical transmission is re-derived and applied for the evaluation of optical parameters. A method based on the pace of the interference pattern is analyzed in detail. It can be used for the determination of the film-thickness, refractive index and absorption coefficient. Small values of the absorption coefficient can be determined as a fitting parameter at all wavelengths, regardless of strong interference. The method is compared to the frequently encountered envelope-method of Manifacier et al. and Swanepoel. The suitability of the method is illustrated on two GaN thin films grown on sapphire. Below the band-gap, the index of refraction of GaN can be described by the equation n(lamda[nm])=2.19+2.57(lamda-345)^( 1/2).

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
098-0982886-2894 - Tanki filmovi legura silicija na prijelazu iz amorfne u uređenu strukturu (Gracin, Davor, MZOS ) ( CroRIS)
098-0982886-2897 - Poluvodički materijali za optoelektroniku i nanotehnologiju (Šantić, Branko, MZOS ) ( CroRIS)

Ustanove:
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Branko Šantić (autor)

Poveznice na cjeloviti tekst rada:

doi iopscience.iop.org doi.org

Citiraj ovu publikaciju:

Šantić, Branko; Scholz, Ferdinand
On the evaluation of optical parameters of a thin semiconductor film from transmission spectra, and application to GaN films // Measurement science & technology, 19 (2008), 10; 105303, 7 doi:10.1088/0957-0233/19/10/105303 (međunarodna recenzija, članak, znanstveni)
Šantić, B. & Scholz, F. (2008) On the evaluation of optical parameters of a thin semiconductor film from transmission spectra, and application to GaN films. Measurement science & technology, 19 (10), 105303, 7 doi:10.1088/0957-0233/19/10/105303.
@article{article, author = {\v{S}anti\'{c}, Branko and Scholz, Ferdinand}, year = {2008}, pages = {7}, DOI = {10.1088/0957-0233/19/10/105303}, chapter = {105303}, keywords = {thin films, semiconductors, optical transmission}, journal = {Measurement science and technology}, doi = {10.1088/0957-0233/19/10/105303}, volume = {19}, number = {10}, issn = {0957-0233}, title = {On the evaluation of optical parameters of a thin semiconductor film from transmission spectra, and application to GaN films}, keyword = {thin films, semiconductors, optical transmission}, chapternumber = {105303} }
@article{article, author = {\v{S}anti\'{c}, Branko and Scholz, Ferdinand}, year = {2008}, pages = {7}, DOI = {10.1088/0957-0233/19/10/105303}, chapter = {105303}, keywords = {thin films, semiconductors, optical transmission}, journal = {Measurement science and technology}, doi = {10.1088/0957-0233/19/10/105303}, volume = {19}, number = {10}, issn = {0957-0233}, title = {On the evaluation of optical parameters of a thin semiconductor film from transmission spectra, and application to GaN films}, keyword = {thin films, semiconductors, optical transmission}, chapternumber = {105303} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Citati:





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