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Pregled bibliografske jedinice broj: 309479

Complementarities of nuclear-based analytical techniques for the characterization of thin film technological materials

Bamford, S.; Kregsamer, P.; Fazinić, Stjepko; Jakšić, Milko; Wegrzynek, D.; Chinea-Cano, E.; Markowicz, A.
Complementarities of nuclear-based analytical techniques for the characterization of thin film technological materials // Nuclear Instruments and Methods in Physics Research Section B - Beam Interactions with Materials and Atoms, 261 (2007), 1-2; 541-543 (međunarodna recenzija, članak, znanstveni)

CROSBI ID: 309479 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Complementarities of nuclear-based analytical techniques for the characterization of thin film technological materials

Autori
Bamford, S. ; Kregsamer, P. ; Fazinić, Stjepko ; Jakšić, Milko ; Wegrzynek, D. ; Chinea-Cano, E. ; Markowicz, A.

Izvornik
Nuclear Instruments and Methods in Physics Research Section B - Beam Interactions with Materials and Atoms (0168-583X) 261 (2007), 1-2; 541-543

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
characterization; thin films; nuclear-based techniques; EDXRF

Sažetak
Two thin film technological materials (A/B) from the aerospace industry have been characterized for their elemental composition, for the purpose of determining their purity and trace element distribution. The results contribute to the assessment of the materials’ suitability as part of a spacecraft’ s thermal hardware. Analysis was done using a combination of PIXE/RBS and energy dispersive X-ray fluorescence (EDXRF) analytical techniques. Samples of the materials were analyzed with PIXE/RBS system using 2 MeV proton beam from a 1 MV Tandetron accelerator and also with separate EDXRF systems employing Am-241 and Mo-secondary target as excitation sources. PIXE/RBS measurements enabled identification of the elemental composition and elucidation of the layer structure of the materials. From the PIXE/RBS results, Am-241-excited EDXRF technique was selected for quantitative determination of indium (In) and tin (Sn) by their K-X-rays, after reasonable absorption corrections. A comparison has been made of the results obtained from EDXRF and PIXE/RBS. Material A has been found to be a thin film with three layers, while material B is a thin film comprised of four layers. Thicknesses and compositions (including trace elements) of all layers have been determined. The limitation of EDXRF in the analysis of inhomogeneously distributed elements was overcome by using PIXE/RBS as an appropriate complimentary technique.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA

Projekti:
098-1191005-2876 - Procesi interakcije ionskih snopova i nanostrukture (Jakšić, Milko, MZOS ) ( CroRIS)

Ustanove:
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Milko Jakšić (autor)

Avatar Url Stjepko Fazinić (autor)

Citiraj ovu publikaciju:

Bamford, S.; Kregsamer, P.; Fazinić, Stjepko; Jakšić, Milko; Wegrzynek, D.; Chinea-Cano, E.; Markowicz, A.
Complementarities of nuclear-based analytical techniques for the characterization of thin film technological materials // Nuclear Instruments and Methods in Physics Research Section B - Beam Interactions with Materials and Atoms, 261 (2007), 1-2; 541-543 (međunarodna recenzija, članak, znanstveni)
Bamford, S., Kregsamer, P., Fazinić, S., Jakšić, M., Wegrzynek, D., Chinea-Cano, E. & Markowicz, A. (2007) Complementarities of nuclear-based analytical techniques for the characterization of thin film technological materials. Nuclear Instruments and Methods in Physics Research Section B - Beam Interactions with Materials and Atoms, 261 (1-2), 541-543.
@article{article, author = {Bamford, S. and Kregsamer, P. and Fazini\'{c}, Stjepko and Jak\v{s}i\'{c}, Milko and Wegrzynek, D. and Chinea-Cano, E. and Markowicz, A.}, year = {2007}, pages = {541-543}, keywords = {characterization, thin films, nuclear-based techniques, EDXRF}, journal = {Nuclear Instruments and Methods in Physics Research Section B - Beam Interactions with Materials and Atoms}, volume = {261}, number = {1-2}, issn = {0168-583X}, title = {Complementarities of nuclear-based analytical techniques for the characterization of thin film technological materials}, keyword = {characterization, thin films, nuclear-based techniques, EDXRF} }
@article{article, author = {Bamford, S. and Kregsamer, P. and Fazini\'{c}, Stjepko and Jak\v{s}i\'{c}, Milko and Wegrzynek, D. and Chinea-Cano, E. and Markowicz, A.}, year = {2007}, pages = {541-543}, keywords = {characterization, thin films, nuclear-based techniques, EDXRF}, journal = {Nuclear Instruments and Methods in Physics Research Section B - Beam Interactions with Materials and Atoms}, volume = {261}, number = {1-2}, issn = {0168-583X}, title = {Complementarities of nuclear-based analytical techniques for the characterization of thin film technological materials}, keyword = {characterization, thin films, nuclear-based techniques, EDXRF} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus

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