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Pregled bibliografske jedinice broj: 308281

GISAXS study of Si nanoclusters in SiO/SiO2 layers

Pivac, Branko; Dubček, Pavo; Capan, Ivana; Radić, Nikola; Bernstorff, Sigrid
GISAXS study of Si nanoclusters in SiO/SiO2 layers // Vacuum, 82 (2008), 2; 189-192 doi:10.1016/j.vacuum.2007.07.024 (međunarodna recenzija, članak, znanstveni)

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Naslov
GISAXS study of Si nanoclusters in SiO/SiO2 layers

Autori
Pivac, Branko ; Dubček, Pavo ; Capan, Ivana ; Radić, Nikola ; Bernstorff, Sigrid

Izvornik
Vacuum (0042-207X) 82 (2008), 2; 189-192

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Silicon nanostructures ; SiO/SiO2 superlattice ; Solar cells ; Grazing-incidence small-angle X-ray scattering

Sažetak
We present a study on amorphous SiO/SiO2 superlattice using grazing-incidence small-angle X-ray scattering (GISAXS). Such nanostructured material might be of great interest for photovoltaic conversion and optoelectronics. Amorphous SiO/SiO2 superlattices were prepared by magnetron sputtering of thin SiO and SiO2 films (20 layers each) on Si (1 0 0) substrate. Rotation of the Si substrate during evaporation ensures homogeneity of the films over the whole substrate. After the evaporation, the samples were annealed at 1100 1C for 1 h in vacuum. The analysis of the 2-D GISAXS pattern has shown that Si nanocrystals are formed in the remaining SiO2 films in the annealed samples. From the 2-D GISAXS pattern, their shape, size and inter-particle distance are determined.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA

Projekti:
098-0982886-2866 - Temeljna svojstva nanostruktura i defekata u poluvodičima i dielektricima (Pivac, Branko, MZOS ) ( CroRIS)
098-0982886-2895 - Novi amorfni i nanostrukturirani tankoslojni materijali (Radić, Nikola, MZOS ) ( CroRIS)

Ustanove:
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Nikola Radić (autor)

Avatar Url Branko Pivac (autor)

Avatar Url Pavo Dubček (autor)

Avatar Url Ivana Capan (autor)

Poveznice na cjeloviti tekst rada:

doi www.sciencedirect.com doi.org

Citiraj ovu publikaciju:

Pivac, Branko; Dubček, Pavo; Capan, Ivana; Radić, Nikola; Bernstorff, Sigrid
GISAXS study of Si nanoclusters in SiO/SiO2 layers // Vacuum, 82 (2008), 2; 189-192 doi:10.1016/j.vacuum.2007.07.024 (međunarodna recenzija, članak, znanstveni)
Pivac, B., Dubček, P., Capan, I., Radić, N. & Bernstorff, S. (2008) GISAXS study of Si nanoclusters in SiO/SiO2 layers. Vacuum, 82 (2), 189-192 doi:10.1016/j.vacuum.2007.07.024.
@article{article, author = {Pivac, Branko and Dub\v{c}ek, Pavo and Capan, Ivana and Radi\'{c}, Nikola and Bernstorff, Sigrid}, year = {2008}, pages = {189-192}, DOI = {10.1016/j.vacuum.2007.07.024}, keywords = {Silicon nanostructures, SiO/SiO2 superlattice, Solar cells, Grazing-incidence small-angle X-ray scattering}, journal = {Vacuum}, doi = {10.1016/j.vacuum.2007.07.024}, volume = {82}, number = {2}, issn = {0042-207X}, title = {GISAXS study of Si nanoclusters in SiO/SiO2 layers}, keyword = {Silicon nanostructures, SiO/SiO2 superlattice, Solar cells, Grazing-incidence small-angle X-ray scattering} }
@article{article, author = {Pivac, Branko and Dub\v{c}ek, Pavo and Capan, Ivana and Radi\'{c}, Nikola and Bernstorff, Sigrid}, year = {2008}, pages = {189-192}, DOI = {10.1016/j.vacuum.2007.07.024}, keywords = {Silicon nanostructures, SiO/SiO2 superlattice, Solar cells, Grazing-incidence small-angle X-ray scattering}, journal = {Vacuum}, doi = {10.1016/j.vacuum.2007.07.024}, volume = {82}, number = {2}, issn = {0042-207X}, title = {GISAXS study of Si nanoclusters in SiO/SiO2 layers}, keyword = {Silicon nanostructures, SiO/SiO2 superlattice, Solar cells, Grazing-incidence small-angle X-ray scattering} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus

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