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Pregled bibliografske jedinice broj: 294956

RT Level Power Analysis


Zhu, Jianwen; Agrawal, Poonam; Gajski, Daniel D.
RT Level Power Analysis // Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Chiba, Japan, 1997. str. 517-522 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)


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Naslov
RT Level Power Analysis

Autori
Zhu, Jianwen ; Agrawal, Poonam ; Gajski, Daniel D.

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC / - , 1997, 517-522

Skup
Asia and South Pacific Design Automation Conference, ASP-DAC

Mjesto i datum
Chiba, Japan, 28.01.1997. - 31.01.1997

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
Capacitance; Energy dissipation; Estimation; Integrated circuit testing; Semiconductor device models

Sažetak
Elevating power estimation to architectural and behavioral level is essential for design exploration beyond logic level. In contrast with purely statistical approach, an analytical model is presented to estimate the power consumption in datapath and controller for a given RT level design. Experimental result shows that order of magnitude speed-up over low level tools as well as satisfactory accuracy can be achieved. This work can also serve as the basis for behavioral level estimation tool.

Izvorni jezik
Engleski

Znanstvena područja
Računarstvo



POVEZANOST RADA


Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb

Profili:

Avatar Url Daniel Gajski (autor)


Citiraj ovu publikaciju:

Zhu, Jianwen; Agrawal, Poonam; Gajski, Daniel D.
RT Level Power Analysis // Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Chiba, Japan, 1997. str. 517-522 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
Zhu, J., Agrawal, P. & Gajski, D. (1997) RT Level Power Analysis. U: Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC.
@article{article, author = {Zhu, Jianwen and Agrawal, Poonam and Gajski, Daniel D.}, year = {1997}, pages = {517-522}, keywords = {Capacitance, Energy dissipation, Estimation, Integrated circuit testing, Semiconductor device models}, title = {RT Level Power Analysis}, keyword = {Capacitance, Energy dissipation, Estimation, Integrated circuit testing, Semiconductor device models}, publisherplace = {Chiba, Japan} }
@article{article, author = {Zhu, Jianwen and Agrawal, Poonam and Gajski, Daniel D.}, year = {1997}, pages = {517-522}, keywords = {Capacitance, Energy dissipation, Estimation, Integrated circuit testing, Semiconductor device models}, title = {RT Level Power Analysis}, keyword = {Capacitance, Energy dissipation, Estimation, Integrated circuit testing, Semiconductor device models}, publisherplace = {Chiba, Japan} }




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