Pregled bibliografske jedinice broj: 277438
Report on EMC Integrated Simulations
Report on EMC Integrated Simulations, 2006. (izvještaj).
CROSBI ID: 277438 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Report on EMC Integrated Simulations
Autori
Čeperić, Vladimir ; Marković, Hrvoje ; Bako, Niko ; Barić, Adrijan ; Gillon, Renaud ; Jović, Ognjen ; Maier, Christian ; Heinisch, Holger
Izvornik
FP6 project ROBUSPIC
Vrsta, podvrsta
Ostale vrste radova, izvještaj
Godina
2006
Ključne riječi
elektromagnetska kompatibilnost
(electromagnetic compatibility)
Sažetak
During the design process it is very important to estimate EM behaviour of the designed circuit. Not only that electronic equipment producers are bound by EMC standards, but ICs are the root causes of disturbances in electronic equipment and systems. The standards regarding conducted EME (Electromagnetic Emission) and EMI (Electromagnetic Immunity) have to be measured and simulated as the first step towards EM compatibility. It is very time consuming to perform full-chip transistor-level simulations as the circuits can be very complex even without considering EMC-aware simulations. Thus, suitable models and their usability for EMC simulations must be determined. The IEC 61967-4 and IEC 62132-4 standards for the 1/150 Ohm and Direct RF Power Injection method are described. The measurement set-up is presented and suggestions on how to successfully create netlists for EMC simulations are given. Also, parasitic extraction and various simulation strategies are addressed. The extraction of on-chip, packaging and PCB parasitics is discussed and the models used in EMC simulations are described. The usage of artificial neural network for EMI current source modelling is shown. The tool for simulation of EMC standards in the Cadence environment is presented. The procedure for optimizations of integrated circuits with respect to electromagnetic compatibility is also given. The measurements and simulations of the conducted EM emissions of a ring oscillator are described as well as the EMC test chip and comparison of EMC simulations with measurements.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika