Naslov
Scattering chamber for thin film analysis at the accelerator facility in Zagreb

Autori
Siketić, Zdravko ; Bogdanović Radović, Ivančica ; Jakšić, Milko

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
IBA 2005 / - Sevilla, 2005

Skup
XVII International Conference on Ion Beam Analysis

Mjesto i datum
Sevilla, Španjolska, 26.06.2005. - 01.07.2005

Vrsta sudjelovanja
Poster

Vrsta recenzije
Nije recenziran

Ključne riječi
EN Tandem; ERDA

Sažetak
A dedicated spherical scattering chamber has been constructed for thin film analysis. Installed at the beam line that can accept ion beams from either 6 MV EN Tandem or 1.0 MV Tandetron accelerator, a system is developed for a wide range of analytical tasks and sample thicknesses. The main detector system is based on time-of-flight spectrometer. It consists of two mirror type systems with MCP electron detector for timing. These timing detectors are separated by 73 cm. Energy detector placed at the end of spectrometer is a 300 mm2 silicon detector for detection of recoiled and scattered ions. Fine adjustments of sample orientation are performed with a motorized sample stage. For ERDA measurements with heavy ion beams, a time-of-flight spectrometer is positioned at 37, 5°. Alternatively, spectrometer can be placed at backward angle of the same chamber for time-of-flight RBS analysis with lower energy light ion beams from Tandetron accelerator. Due to similar design of this scattering chamber with nuclear microprobe scattering chamber, a time-of-flight spectrometer can be easily interchanged with IEE ERDA spectrometer for H analysis mounted usually at the nuclear microprobe. Characteristics of this new system as well as the first applications will be presented.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

POVEZANOST RADA